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"lei tan fu"的相關文件
顯示項目 46-95 / 112 (共3頁)
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| 國立交通大學 |
2014-12-08T15:25:30Z |
Analysis of pentacene thin film transistors in different atmospheres
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Wang, Yu-Wu; Cheng, Horng-Long; Wang, Yi-Kai; Hu, Tang-Hsiang; Ho, Jia-Chong; Lee, Cheng-Chung; Lei, Tan-Fu; Yeh, Ching-Fa |
| 國立交通大學 |
2014-12-08T15:25:06Z |
Effect of chemical mechanical polish process on low-temperature poly-SiGe thin-film transistors
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Shieh, Ming-Shan; Chen, Chih-Yang; Hsu, Yuan-Jiun; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:25:06Z |
Process induced instability and reliability issues in low temperature poly-Si thin film transistors
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Chen, Chih-Yang; Wang, Shen-De; Shieh, Ming-Shan; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Jam-Wen; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:17:43Z |
PolySi-SiO2-ZrO2-SiO2-Si flash memory incorporating a sol-gel-derived ZrO2 charge trapping layer
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Hsu, Tzu-Hsiang; You, Hsin-Chiang; Ko, Fu-Hsiang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:16:08Z |
Hafnium silicate nanocrystal memory using sol-gel-spin-coating method
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You, Hsin-Chiang; Hsu, Tze-Hsiang; Ko, Fu-Hsiang; Huang, Jiang-Wen; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:16:08Z |
SONOS-type flash memory using an HfO2 as a charge trapping layer deposited by the sol-gel spin-coating method
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You, Hsin-Chiang; Hsu, Tze-Hsiang; Ko, Fu-Hsiang; Huang, Jiang-Wen; Yang, Wen-Luh; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:57Z |
Fringing electric field effect on 65-nm-node fully depleted silicon-on-insulator devices
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Ma, Ming-Wen; Chao, Tien-Sheng; Kao, Kuo-Hsing; Huang, Jyun-Siang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:43Z |
The impact of deep Ni salicidation and NH3 plasma treatment on nano-SOI FinFETs
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You, Hsin-Chiang; Kuo, Po-Yi; Ko, Fu-Hsiang; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:32Z |
High-kappa material sidewall with source/drain-to-gate non-overlapped structure for low standby power applications
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Ma, Ming-Wen; Chao, Tien-Sheng; Kao, Kuo-Hsing; Huang, Jyun-Siang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:31Z |
Plasma damage-enhanced negative bias temperature instability in low-temperature polycrystalline silicon thin-film transistors
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Chen, Chih-Yang; Lee, Jam-Wem; Chen, Wei-g Chen; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Po-Hao; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:12Z |
Sol-gel-derived double-layered nanocrystal memory
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Ko, Fu-Hsiang; You, Hsin-Chiang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:11Z |
Nitrogen effects on the integrity of silicon dioxide grown on polycrystalline silicon
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Lai, Chao Sung; Kao, Chyuan Haur; Lee, Chung Len; Lei, Tan Fu |
| 國立交通大學 |
2014-12-08T15:15:11Z |
Si nanocrystal memory devices self-assembled by in situ rapid thermal annealing of ultrathin a-Si on SiO2
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Chen, Jian-Hao; Lei, Tan-Fu; Landheer, Dolf; Wu, Xiaohua; Liu, Jian; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:15:10Z |
Plasma-induced damage on the performance and reliability of low-temperature polycrystalline silicon thin-film transistors
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Chen, Chih-Yang; Wang, Shen-De; Shieh, Ming-Shan; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Jam-Wem; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:07Z |
Characteristics of Pr2O3 gate dielectric thin-film transistors fabricated on fluorine-ion-implanted polysilicon films
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Chang, Chia-Wen; Deng, Chih-Kang; Huang, Jiun-Jia; Chang, Hong-Ren; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:06Z |
Two-bit lanthanum oxide trapping layer nonvolatile flash memory
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Lin, Yu-Hsien; Chien, Chao-Hsin; Yang, Tsung-Yuan; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:06Z |
Bias temperature instabilities for low-temperature polycrystalline silicon complementary thin-film transistors
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Chen, Chih-Yang; Lee, Jam-Wem; Ma, Ming-Wen; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:05Z |
Fabrication of SONOS-type flash memory with the binary high-k dielectrics by the sol-gel spin coating method
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Ko, Fu-Hsiang; You, Hsin-Chiang; Chang, Chun-Ming; Yang, Wen-Luh; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:03Z |
Performance improvement of CoTiO3 high-k dielectrics with nitrogen incorporation
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Chen, Jian Hao; Huang, Tzung Bin; Wu, Xiaohua; Landheer, Dolf; Lei, Tan Fu; Chao, Tien Sheng |
| 國立交通大學 |
2014-12-08T15:14:34Z |
Impact of high-k offset spacer in 65-nm node SOI devices
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Ma, Ming-Wen; Wu, Chien-Hung; Yang, Tsung-Yu; Kao, Kuo-Hsing; Wu, Woei-Cherng; Wang, Shui-Jinn; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:14:31Z |
Low-temperature polycrystalline silicon thin-film flash memory with hafnium silicate
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Lin, Yu-Hsien; Chien, Chao-Hsin; Chou, Tung-Huan; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:14:26Z |
Impact of channel dangling bonds on reliability characteristics of flash memory on poly-Si thin films
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Lin, Yu-Hsien; Chien, Chao-Hsin; Chou, Tung-Huan; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:14:11Z |
A reliability model for low-temperature polycrystalline silicon thin-film transistors
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Chen, Chih-Yang; Lee, Jam-Wem; Lee, Po-Hao; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Ma, Ming-Wen; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:14:07Z |
Characteristics of self-aligned Si/Ge T-gate poly-Si thin-film transistors with high ON/OFF current ratio
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Kuo, Po-Yi; Chao, Tien-Sheng; Hsieh, Pei-Shan; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:13:52Z |
Nonvolatile flash memory devices using CeO2 nanocrystal trapping layer for two-bit per cell applications
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Yang, Shao-Ming; Chien, Chao-Hsin; Huang, Jiun-Jia; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:13:11Z |
A simple Spacer technique to fabricate poly-Si TFTs with 50-nm nanowire channels
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Chang, Chia-Wen; Deng, Chih-Kang; Chang, Hong-Ren; Chang, Che-Lun; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:12:57Z |
Cerium oxide nanocrystals for nonvolatile memory applications
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Yang, Shao-Ming; Chien, Chao-Hsin; Huang, Jiun-Jia; Lei, Tan-Fu; Tsai, Ming-Jinn; Lee, Lurng-Shehng |
| 國立交通大學 |
2014-12-08T15:12:56Z |
Enhanced performance and reliability for solid-phase crystallized poly-Si TFTs with argon ion implantation (vol 154, pg J375, 2007)
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Chang, Chia-Wen; Deng, Chih-Kang; Chang, Che-Lun; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:12:51Z |
CF4-plasma-induced fluorine passivation effects on poly-Si TFTs with high-kappa Pr2O3 gate dielectric
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Chang, Chia-Wen; Huang, Po-Wei; Deng, Chih-Kang; Huang, Jiun-Jia; Chang, Hong-Ren; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:12:40Z |
Characteristics of PBTI and hot carrier stress for LTPS-TFT with high-kappa gate dielectric
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Ma, Ming-Wen; Chen, Chih-Yang; Su, Chun-Jung; Wu, Woei-Cherng; Wu, Yi-Hong; Kao, Kuo-Hsing; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:12:39Z |
Analysis of negative bias temperature instability in body-tied low-temperature polycrystalline silicon thin-film transistors
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Chen, Chih-Yang; Ma, Ming-Wen; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:12:39Z |
Impacts of fluorine ion implantation with low-temperature solid-phase crystallized activation on high-kappa LTPS-TFT
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Ma, Ming-Wen; Chen, Chih-Yang; Su, Chun-Jung; Wu, Woei-Cherng; Wu, Yi-Hong; Yang, Tsung-Yu; Kao, Kuo-Hsing; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:12:37Z |
Electrical enhancement of polycrystalline silicon thin-film transistors using fluorinated silicate glass passivation layer
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Chang, Chia-Wen; Deng, Chih-Kang; Huang, Jiun-Jia; Wang, Tong-Yi; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:12:27Z |
Improvement of electrical characteristics for fluorine-ion implanted poly-Si TFTs using Pr2O3 gate dielectric
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Chang, Chia-Wen; Huang, Jiun-Jia; Chang, Hong-Ren; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:12:26Z |
Electrical enhancement of poly-Si TFTs using FSG ILD passivation
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Huang, Jiun-Jia; Chang, Chia-Wen; Dneg, Chih-Kang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:12:14Z |
High-performance nanowire TFTs with metal-induced lateral crystallized poly-Si channels
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Chang, Chia-Wen; Chen, Szu-Fen; Chang, Che-Lun; Deng, Chih-Kang; Huang, Jiun-Jia; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:12:13Z |
Reliability mechanisms of LTPS-TFT with HfO2 gate dielectric: PBTI, NBTI, and hot-carrier stress
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Ma, Ming-Wen; Chen, Chih-Yang; Wu, Woei-Cherrig; Su, Chun-Jung; Kao, Kuo-Hsing; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:11:54Z |
Improvement of electrical characteristics for novel process-compatible floating channel solid-phase crystallized poly-Si TFTs
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Chang, Chia-Wen; Chang, Che-Lun; Lee, Jam-Wem; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:11:49Z |
Channel Film Thickness Effect of Low-Temperature Polycrystalline-Silicon Thin-Film Transistors
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Ma, William Cheng-Yu; Chiang, Tsung-Yu; Yeh, Chi-Ruei; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:11:36Z |
Mobility improvement of HfO2 LTPS-TFTs with nitrogen implanataion
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Ma, Ming-Wen; Yang, Tsung-Yu; Kao, Kuo-Hsing; Su, Chun-Jung; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:11:34Z |
Impacts of nitric acid oxidation on low-temperature polycrystalline silicon TFTs with high-k gate dielectric
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Yang, Tsung-Yu; Ma, Ming-Wen; Kao, Kuo-Hsing; Su, Chun-Jung; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:11:26Z |
High-performance metal-induced laterally crystallized polycrystalline silicon p-channel thin-film transistor with TaN/HfO2 gate stack structure
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Ma, Ming-Wen; Chao, Tien-Sheng; Su, Chun-Jung; Wu, Woei-Cherng; Kao, Kuo-Hsing; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:11:26Z |
Dynamic negative bias temperature instability in low-temperature poly-Si thin-film transistors
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Chen, Chih-Yang; Wang, Tong-Yi; Ma, Ming-Wen; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:11:25Z |
Performance and reliability improvement for poly-Si TFTs using fluorinated silicate glass inter-layer-dielectric passivation
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Chang, Chia-Wen; Wu, Tin-Wei; Wang, Tong-Yi; Chang, Che-Lun; Lee, Jam-Wem; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:11:25Z |
Characterizing fluorine-ion implant effects on poly-Si thin-film transistors with Pr2O3 gate dielectric
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Chang, Chia-Wen; Deng, Chih-Kang; Wu, Shih-Chieh; Huang, Jiun-Jia; Chang, Hong-Ren; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:11:24Z |
Enhanced performance and reliability for solid phase crystallized poly-Si TFTs with argon ion implantation
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Chang, Chia-Wen; Chang, Che-Lun; Luo, Wun-Chen; Lee, Jam-Wem; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:11:17Z |
SONOS memories with embedded silicon nanocrystals in nitride
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Liu, Mei-Chun; Chiang, Tsung-Yu; Kuo, Po-Yi; Chou, Ming-Hong; Wu, Yi-Hong; You, Hsin-Chiang; Cheng, Ching-Hwa; Liu, Sheng-Hsien; Yang, Wen-Luh; Lei, Tan-Fu; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:10:43Z |
Impacts of N-2 and NH3 Plasma Surface Treatments on High-Performance LTPS-TFT With High-kappa Gate Dielectric
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Ma, Ming-Wen; Chao, Tien-Sheng; Chiang, Tsung-Yu; Wu, Woei-Cherng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:10:33Z |
Characteristics of HfO(2)/Poly-Si Interfacial Layer on CMOS LTPS-TFTs With HfO(2) Gate Dielectric and O(2) Plasma Surface Treatment
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Ma, Ming-Wen; Chiang, Tsung-Yu; Wu, Woei-Cherng; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:10:28Z |
Electrical Characteristics of High Performance SPC and MILC p-Channel LTPS-TFT with High-kappa Gate Dielectric
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Ma, Ming-Wen; Chiang, Tsung-Yu; Yeh, Chi-Ruei; Chao, Tien-Sheng; Lei, Tan-Fu |
顯示項目 46-95 / 112 (共3頁)
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