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"lei tan fu"的相关文件
显示项目 51-60 / 112 (共12页)
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| 國立交通大學 |
2014-12-08T15:16:08Z |
SONOS-type flash memory using an HfO2 as a charge trapping layer deposited by the sol-gel spin-coating method
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You, Hsin-Chiang; Hsu, Tze-Hsiang; Ko, Fu-Hsiang; Huang, Jiang-Wen; Yang, Wen-Luh; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:57Z |
Fringing electric field effect on 65-nm-node fully depleted silicon-on-insulator devices
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Ma, Ming-Wen; Chao, Tien-Sheng; Kao, Kuo-Hsing; Huang, Jyun-Siang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:43Z |
The impact of deep Ni salicidation and NH3 plasma treatment on nano-SOI FinFETs
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You, Hsin-Chiang; Kuo, Po-Yi; Ko, Fu-Hsiang; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:32Z |
High-kappa material sidewall with source/drain-to-gate non-overlapped structure for low standby power applications
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Ma, Ming-Wen; Chao, Tien-Sheng; Kao, Kuo-Hsing; Huang, Jyun-Siang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:31Z |
Plasma damage-enhanced negative bias temperature instability in low-temperature polycrystalline silicon thin-film transistors
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Chen, Chih-Yang; Lee, Jam-Wem; Chen, Wei-g Chen; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Po-Hao; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:12Z |
Sol-gel-derived double-layered nanocrystal memory
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Ko, Fu-Hsiang; You, Hsin-Chiang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:11Z |
Nitrogen effects on the integrity of silicon dioxide grown on polycrystalline silicon
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Lai, Chao Sung; Kao, Chyuan Haur; Lee, Chung Len; Lei, Tan Fu |
| 國立交通大學 |
2014-12-08T15:15:11Z |
Si nanocrystal memory devices self-assembled by in situ rapid thermal annealing of ultrathin a-Si on SiO2
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Chen, Jian-Hao; Lei, Tan-Fu; Landheer, Dolf; Wu, Xiaohua; Liu, Jian; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:15:10Z |
Plasma-induced damage on the performance and reliability of low-temperature polycrystalline silicon thin-film transistors
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Chen, Chih-Yang; Wang, Shen-De; Shieh, Ming-Shan; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Jam-Wem; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:07Z |
Characteristics of Pr2O3 gate dielectric thin-film transistors fabricated on fluorine-ion-implanted polysilicon films
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Chang, Chia-Wen; Deng, Chih-Kang; Huang, Jiun-Jia; Chang, Hong-Ren; Lei, Tan-Fu |
显示项目 51-60 / 112 (共12页)
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