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"lei tan fu"的相關文件
顯示項目 51-75 / 112 (共5頁)
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| 國立交通大學 |
2014-12-08T15:16:08Z |
SONOS-type flash memory using an HfO2 as a charge trapping layer deposited by the sol-gel spin-coating method
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You, Hsin-Chiang; Hsu, Tze-Hsiang; Ko, Fu-Hsiang; Huang, Jiang-Wen; Yang, Wen-Luh; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:57Z |
Fringing electric field effect on 65-nm-node fully depleted silicon-on-insulator devices
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Ma, Ming-Wen; Chao, Tien-Sheng; Kao, Kuo-Hsing; Huang, Jyun-Siang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:43Z |
The impact of deep Ni salicidation and NH3 plasma treatment on nano-SOI FinFETs
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You, Hsin-Chiang; Kuo, Po-Yi; Ko, Fu-Hsiang; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:32Z |
High-kappa material sidewall with source/drain-to-gate non-overlapped structure for low standby power applications
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Ma, Ming-Wen; Chao, Tien-Sheng; Kao, Kuo-Hsing; Huang, Jyun-Siang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:31Z |
Plasma damage-enhanced negative bias temperature instability in low-temperature polycrystalline silicon thin-film transistors
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Chen, Chih-Yang; Lee, Jam-Wem; Chen, Wei-g Chen; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Po-Hao; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:12Z |
Sol-gel-derived double-layered nanocrystal memory
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Ko, Fu-Hsiang; You, Hsin-Chiang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:11Z |
Nitrogen effects on the integrity of silicon dioxide grown on polycrystalline silicon
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Lai, Chao Sung; Kao, Chyuan Haur; Lee, Chung Len; Lei, Tan Fu |
| 國立交通大學 |
2014-12-08T15:15:11Z |
Si nanocrystal memory devices self-assembled by in situ rapid thermal annealing of ultrathin a-Si on SiO2
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Chen, Jian-Hao; Lei, Tan-Fu; Landheer, Dolf; Wu, Xiaohua; Liu, Jian; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:15:10Z |
Plasma-induced damage on the performance and reliability of low-temperature polycrystalline silicon thin-film transistors
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Chen, Chih-Yang; Wang, Shen-De; Shieh, Ming-Shan; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Jam-Wem; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:07Z |
Characteristics of Pr2O3 gate dielectric thin-film transistors fabricated on fluorine-ion-implanted polysilicon films
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Chang, Chia-Wen; Deng, Chih-Kang; Huang, Jiun-Jia; Chang, Hong-Ren; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:06Z |
Two-bit lanthanum oxide trapping layer nonvolatile flash memory
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Lin, Yu-Hsien; Chien, Chao-Hsin; Yang, Tsung-Yuan; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:06Z |
Bias temperature instabilities for low-temperature polycrystalline silicon complementary thin-film transistors
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Chen, Chih-Yang; Lee, Jam-Wem; Ma, Ming-Wen; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:05Z |
Fabrication of SONOS-type flash memory with the binary high-k dielectrics by the sol-gel spin coating method
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Ko, Fu-Hsiang; You, Hsin-Chiang; Chang, Chun-Ming; Yang, Wen-Luh; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:03Z |
Performance improvement of CoTiO3 high-k dielectrics with nitrogen incorporation
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Chen, Jian Hao; Huang, Tzung Bin; Wu, Xiaohua; Landheer, Dolf; Lei, Tan Fu; Chao, Tien Sheng |
| 國立交通大學 |
2014-12-08T15:14:34Z |
Impact of high-k offset spacer in 65-nm node SOI devices
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Ma, Ming-Wen; Wu, Chien-Hung; Yang, Tsung-Yu; Kao, Kuo-Hsing; Wu, Woei-Cherng; Wang, Shui-Jinn; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:14:31Z |
Low-temperature polycrystalline silicon thin-film flash memory with hafnium silicate
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Lin, Yu-Hsien; Chien, Chao-Hsin; Chou, Tung-Huan; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:14:26Z |
Impact of channel dangling bonds on reliability characteristics of flash memory on poly-Si thin films
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Lin, Yu-Hsien; Chien, Chao-Hsin; Chou, Tung-Huan; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:14:11Z |
A reliability model for low-temperature polycrystalline silicon thin-film transistors
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Chen, Chih-Yang; Lee, Jam-Wem; Lee, Po-Hao; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Ma, Ming-Wen; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:14:07Z |
Characteristics of self-aligned Si/Ge T-gate poly-Si thin-film transistors with high ON/OFF current ratio
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Kuo, Po-Yi; Chao, Tien-Sheng; Hsieh, Pei-Shan; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:13:52Z |
Nonvolatile flash memory devices using CeO2 nanocrystal trapping layer for two-bit per cell applications
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Yang, Shao-Ming; Chien, Chao-Hsin; Huang, Jiun-Jia; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:13:11Z |
A simple Spacer technique to fabricate poly-Si TFTs with 50-nm nanowire channels
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Chang, Chia-Wen; Deng, Chih-Kang; Chang, Hong-Ren; Chang, Che-Lun; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:12:57Z |
Cerium oxide nanocrystals for nonvolatile memory applications
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Yang, Shao-Ming; Chien, Chao-Hsin; Huang, Jiun-Jia; Lei, Tan-Fu; Tsai, Ming-Jinn; Lee, Lurng-Shehng |
| 國立交通大學 |
2014-12-08T15:12:56Z |
Enhanced performance and reliability for solid-phase crystallized poly-Si TFTs with argon ion implantation (vol 154, pg J375, 2007)
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Chang, Chia-Wen; Deng, Chih-Kang; Chang, Che-Lun; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:12:51Z |
CF4-plasma-induced fluorine passivation effects on poly-Si TFTs with high-kappa Pr2O3 gate dielectric
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Chang, Chia-Wen; Huang, Po-Wei; Deng, Chih-Kang; Huang, Jiun-Jia; Chang, Hong-Ren; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:12:40Z |
Characteristics of PBTI and hot carrier stress for LTPS-TFT with high-kappa gate dielectric
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Ma, Ming-Wen; Chen, Chih-Yang; Su, Chun-Jung; Wu, Woei-Cherng; Wu, Yi-Hong; Kao, Kuo-Hsing; Chao, Tien-Sheng; Lei, Tan-Fu |
顯示項目 51-75 / 112 (共5頁)
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