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"lei tf"
Showing items 121-130 of 214 (22 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:05:57Z |
ERROR REDUCTION IN THE ELLIPSOMETRIC MEASUREMENT ON THIN-FILMS
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HO, JH; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:53Z |
TANTALUM SILICIDE SCHOTTKY CONTACTS TO GAAS
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LEE, CP; LIU, TH; LEI, TF; WU, SC |
| 國立交通大學 |
2014-12-08T15:05:52Z |
SWITCHING CHARACTERISTICS OF MINPN DEVICES
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CHANG, DCY; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:51Z |
AN MINPIM STRUCTURE MIXING DEVICE
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CHANG, DCY; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:48Z |
A SWITCHING DEVICE OF A PN JUNCTION STRUCTURE WITH 2 LAYERS OF THIN OXIDE
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CHANG, DCY; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:46Z |
REFRACTIVE-INDEX PROFILE MEASUREMENT OF COMPOUND THIN-FILMS BY ELLIPSOMETRY
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HO, JH; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:39Z |
NUMERICAL-SIMULATION OF THE VERTICAL KELVIN TEST STRUCTURE FOR SPECIFIC CONTACT RESISTIVITY
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LEU, LY; LEE, CL; LEI, TF; YANG, WL |
| 國立交通大學 |
2014-12-08T15:05:38Z |
ELLIPSOMETRY MEASUREMENT OF THE COMPLEX REFRACTIVE-INDEX AND THICKNESS OF POLYSILICON THIN-FILMS
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HO, JH; LEE, CL; LEI, TF; CHAO, TS |
| 國立交通大學 |
2014-12-08T15:05:37Z |
IMPROVEMENT ON THE CURRENT-VOLTAGE CHARACTERISTICS OF POLYCRYSTALLINE SILICON CONTACTED N+-P JUNCTIONS WITH HIGH-FIELD STRESSING
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WU, SL; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:32Z |
ELLIPSOMETRY MEASUREMENTS ON REFRACTIVE-INDEX PROFILES OF THIN-FILMS
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HO, JH; LEE, CL; LEI, TF |
Showing items 121-130 of 214 (22 Page(s) Totally)
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