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"lei tf"的相关文件
显示项目 121-145 / 214 (共9页)
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| 國立交通大學 |
2014-12-08T15:05:57Z |
ERROR REDUCTION IN THE ELLIPSOMETRIC MEASUREMENT ON THIN-FILMS
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HO, JH; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:53Z |
TANTALUM SILICIDE SCHOTTKY CONTACTS TO GAAS
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LEE, CP; LIU, TH; LEI, TF; WU, SC |
| 國立交通大學 |
2014-12-08T15:05:52Z |
SWITCHING CHARACTERISTICS OF MINPN DEVICES
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CHANG, DCY; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:51Z |
AN MINPIM STRUCTURE MIXING DEVICE
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CHANG, DCY; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:48Z |
A SWITCHING DEVICE OF A PN JUNCTION STRUCTURE WITH 2 LAYERS OF THIN OXIDE
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CHANG, DCY; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:46Z |
REFRACTIVE-INDEX PROFILE MEASUREMENT OF COMPOUND THIN-FILMS BY ELLIPSOMETRY
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HO, JH; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:39Z |
NUMERICAL-SIMULATION OF THE VERTICAL KELVIN TEST STRUCTURE FOR SPECIFIC CONTACT RESISTIVITY
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LEU, LY; LEE, CL; LEI, TF; YANG, WL |
| 國立交通大學 |
2014-12-08T15:05:38Z |
ELLIPSOMETRY MEASUREMENT OF THE COMPLEX REFRACTIVE-INDEX AND THICKNESS OF POLYSILICON THIN-FILMS
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HO, JH; LEE, CL; LEI, TF; CHAO, TS |
| 國立交通大學 |
2014-12-08T15:05:37Z |
IMPROVEMENT ON THE CURRENT-VOLTAGE CHARACTERISTICS OF POLYCRYSTALLINE SILICON CONTACTED N+-P JUNCTIONS WITH HIGH-FIELD STRESSING
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WU, SL; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:32Z |
ELLIPSOMETRY MEASUREMENTS ON REFRACTIVE-INDEX PROFILES OF THIN-FILMS
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HO, JH; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:26Z |
IMPROVEMENT OF ELECTRICAL CHARACTERISTICS OF POLYCRYSTALLINE SILICON-CONTACTED DIODES AFTER FORWARD BIAS STRESSING
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WU, SL; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:25Z |
AN SCR WITH SIMPLE MIS STRUCTURE
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CHANG, DCY; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:14Z |
MEASUREMENT OF ULTRATHIN (LESS-THAN-100-A) OXIDE-FILMS BY MULTIPLE-ANGLE INCIDENT ELLIPSOMETRY
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CHAO, TS; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:05:11Z |
A REAL-TIME C-V MEASUREMENT CIRCUIT FOR MOS CAPACITORS UNDER CURRENT STRESSING
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LEE, CL; LEI, TF; HO, JH; WANG, WT |
| 國立交通大學 |
2014-12-08T15:05:03Z |
HIGH-PERFORMANCE POLYSILICON CONTACTED SHALLOW JUNCTIONS FORMED BY STACKED-AMORPHOUS-SILICON FILMS
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WU, SL; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:52Z |
POLY-OXIDE POLY-SI/SIO2/SI STRUCTURE FOR ELLIPSOMETRY MEASUREMENT
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CHAO, TS; LEE, CL; LEI, TF; YEN, YT |
| 國立交通大學 |
2014-12-08T15:04:50Z |
INVESTIGATION ON THE INTERFACE OF THE POLYCRYSTALLINE SILICON CONTACTED DIODE FORMED WITH A STACKED AMORPHOUS-SILICON FILM
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WU, SL; LEE, CL; LEI, TF; LEE, TL; CHEN, LJ |
| 國立交通大學 |
2014-12-08T15:04:48Z |
CHARACTERIZATION OF ULTRATHIN OXIDE PREPARED BY LOW-TEMPERATURE WAFER LOADING AND NITROGEN PREANNEALING BEFORE OXIDATION
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WU, SL; LEE, CL; LEI, TF; LIANG, MS |
| 國立交通大學 |
2014-12-08T15:04:45Z |
A STUDY OF THE INTERFACIAL LAYER OF AL AND AL(1-PERCENT SI)-SI CONTACTS USING A ZERO-LAYER ELLIPSOMETRY MODEL
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CHAO, TS; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:42Z |
THE IMPACT OF TITANIUM SILICIDE ON THE CONTACT RESISTANCE FOR SHALLOW JUNCTION FORMED BY OUT-DIFFUSION OF ARSENIC FROM POLYSILICON
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YANG, WL; LEI, TF; HUANG, CT; LEE, CL |
| 國立交通大學 |
2014-12-08T15:04:37Z |
H-2/O-2 PLASMA ON POLYSILICON THIN-FILM TRANSISTOR
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CHERN, HN; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:37Z |
ELECTRICAL CHARACTERISTICS OF TEXTURED POLYSILICON OXIDE PREPARED BY A LOW-TEMPERATURE WAFER LOADING AND N-2 PREANNEALING PROCESS
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WU, SL; LIN, TY; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:31Z |
THE REFRACTIVE-INDEX OF INP AND ITS OXIDE MEASURED BY MULTIPLE-ANGLE INCIDENT ELLIPSOMETRY
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CHAO, TS; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:29Z |
ULTRATHIN TEXTURED POLYCRYSTALLINE OXIDE WITH A HIGH ELECTRON CONDUCTION EFFICIENCY PREPARED BY THERMAL-OXIDATION OF THIN POLYCRYSTALLINE SILICON FILM ON N+ POLYCRYSTALLINE SILICON
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WU, SL; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:29Z |
THICKNESS DETERMINATION OF POLY-SI/POLY-OXIDE POLY-SI/SIO2/SI STRUCTURE BY ELLIPSOMETER
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CHAO, TS; LEE, CL; LEI, TF |
显示项目 121-145 / 214 (共9页)
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