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"lei tf"
Showing items 181-190 of 214 (22 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:03:13Z |
THE ELECTRICAL CHARACTERISTICS OF POLYSILICON OXIDE GROWN IN PURE N2O
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LAI, CS; LEI, TF; LEE, CL |
| 國立交通大學 |
2014-12-08T15:03:10Z |
A NOVEL PLANARIZATION OF TRENCH ISOLATION USING POLYSILICON REFILL AND ETCHBACK OF CHEMICAL-MECHANICAL POLISH
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CHENG, JY; LEI, TF; CHAO, TS |
| 國立交通大學 |
2014-12-08T15:03:07Z |
HIGH BREAKDOWN VOLTAGE SCHOTTKY-BARRIER DIODE USING P(+)-POLYCRYSTALLINE SILICON DIFFUSED GUARD RING
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LIOU, BW; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:03:06Z |
POST-POLYSILICON GATE-PROCESS-INDUCED DEGRADATION ON THIN GATE OXIDE
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LAI, CS; LEI, TF; LEE, CL; CHAO, TS |
| 國立交通大學 |
2014-12-08T15:03:04Z |
PTGE OHMIC CONTACT TO N-TYPE INP
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HUANG, WC; LEI, TF; LEE, CL |
| 國立交通大學 |
2014-12-08T15:03:03Z |
LOW-TEMPERATURE GROWTH OF SILICON-BORON LAYER AS SOLID DIFFUSION SOURCE FOR POLYSILICON CONTACTED P(+)-N SHALLOW JUNCTION
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LEI, TF; CHEN, TP; LIN, HC; CHANG, CY |
| 國立交通大學 |
2014-12-08T15:03:03Z |
CHARACTERISTICS OF TOP-GATE THIN-FILM TRANSISTORS FABRICATED ON NITROGEN-IMPLANTED POLYSILICON FILMS
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YANG, CK; LEI, TF; LEE, CL |
| 國立交通大學 |
2014-12-08T15:03:01Z |
CHARACTERISTICS OF POLYCRYSTALLINE FILMS GROWN BY ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION SYSTEM
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LIN, HY; LEI, TF; LIN, HC; CHANG, CY; TWU, RC; DENG, RC; LIN, JD |
| 國立交通大學 |
2014-12-08T15:03:00Z |
RADIATION EFFECTS ON N-CHANNEL POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS
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YANG, CK; LEE, CL; LEI, TF; CHERN, HN |
| 國立交通大學 |
2014-12-08T15:02:53Z |
Characterization of thin textured tunnel oxide prepared by thermal oxidation of thin polysilicon film on silicon
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Wu, SL; Chiao, DM; Lee, CL; Lei, TF |
Showing items 181-190 of 214 (22 Page(s) Totally)
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