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机构 日期 题名 作者
國立交通大學 2017-04-21T06:55:16Z Suspended Diamond-Shaped Nanowire With Four {111} Facets for High-Performance Ge Gate-All-Around FETs Hou, Fu-Ju; Sung, Po-Jung; Hsueh, Fu-Kuo; Wu, Chien-Ting; Lee, Yao-Jen; Li, Yiming; Samukawa, Seiji; Hou, Tuo-Hung
國立交通大學 2017-04-21T06:55:15Z A Novel Driving Method for High-Performance Amorphous Silicon Gate Driver Circuits in Flat Panel Display Industry Chiang, Chien-Hsueh; Li, Yiming
國立交通大學 2017-04-21T06:49:59Z 50% Efficiency Intermediate Band Solar Cell Design Using Highly Periodical Silicon Nanodisk Array Hu, Weiguo; Igarashi, Makoto; Lee, Ming-Yi; Li, Yiming; Samukawa, Seiji
國立交通大學 2017-04-21T06:49:47Z Experimentally Effective Clean Process to C-V Characteristic Variation Reduction of HKMG MOS Devices Chen, Chien-Hung; Li, Yiming; Chen, Chieh-Yang; Chen, Yu-Yu; Hsu, Sheng-Chia; Huang, Wen-Tsung; Chu, Sheng-Yuan
國立交通大學 2017-04-21T06:49:39Z 3D 65nm CMOS with 320 degrees C Microwave Dopant Activation Lee, Yao-Jen; Lu, Yu-Lun; Hsueh, Fu-Kuo; Huang, Kuo-Chin; Wan, Chia-Chen; Cheng, Tz-Yen; Han, Ming-Hung; Kowalski, Jeff M.; Kowalski, Jeff E.; Heh, Dawei; Chuang, Hsi-Ta; Li, Yiming; Chao, Tien-Sheng; Wu, Ching-Yi; Yang, Fu-Liang
國立交通大學 2017-04-21T06:49:39Z Electrical characteristic fluctuations in sub-45nm CMOS devices Yang, Fu-Liang; Hwang, Jiunn-Ren; Li, Yiming
國立交通大學 2017-04-21T06:49:29Z Nanosized-Metal-Grain-Induced Characteristic Fluctuation in Gate-All-Around Si Nanowire Metal-Oxide-Semiconductor Devices Lai, Chun-Ning; Chen, Chien-Yang; Li, Yiming
國立交通大學 2017-04-21T06:49:29Z Electronic Structure Dependence on the Density, Size and Shape of Ge/Si Quantum Dots Array Lee, Ming-Yi; Tsai, Yi-Chia; Li, Yiming; Samukawat, Seiji
國立交通大學 2017-04-21T06:49:27Z On Characteristic Fluctuation of Nonideal Bulk FinFET Devices Li, Yiming; Huang, Wen-Tsung
國立交通大學 2017-04-21T06:49:26Z Prioritization of Key In-Line Process Parameters for Electrical Characteristic Optimization of High-k Metal Gate Bulk FinFET Devices Su, Ping-Husn; Li, Yiming

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