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机构 日期 题名 作者
國立交通大學 2014-12-08T15:15:56Z Transmission electron microscopy studies of GaAs nanostructures in InGaAs/InP matrix grown by molecular beam epitaxy Lin, S. D.; Lin, Z. C.; Lee, C. P.
國立交通大學 2014-12-08T15:14:39Z Mobility asymmetry in InGaAs/InAlAs heterostructures with InAs quantum wires Lin, Z. C.; Hsieh, W. H.; Lee, C. P.; Suen, Y. W.
國立交通大學 2014-12-08T15:12:46Z Ordering of stacked InAs/GaAs quantum-wires in InAlAs/InGaAs matrix on (100) InP substrates Lin, Z. C.; Lin, S. D.; Lee, C. P.
國立臺灣科技大學 2014 Abrasive removal depth for polishing a sapphire wafer by a cross-patterned polishing pad with different abrasive particle sizes Lin, Z.-C.;Wang, R.-Y.
國立臺灣科技大學 2014 Simulation of temperature field during nanoscale orthogonal cutting of single-crystal silicon by molecular statics method Lin, Z.-C.;Lin, M.-H.;Hsu, Y.-C.
國立臺灣科技大學 2014 Fabrication method and experiment study of nanoscale trapezoidal groove on sapphire substrate by using atomic force microscope under a fixed cutting depth and changed down force Lin, Z.-C.;Tsai, J.-S.;Hsu, Y.-C.;Lin, C.-T.
國立臺灣科技大學 2014 A study of simulation of three-dimensional quasi-steady molecular statics nanoscale orthogonal cutting of single-crystal silicon material having rows of atoms with vacancy defect Lin, Z.-C.;Jian, C.-S.;Wang, R.-Y.
國立臺灣科技大學 2013 Simulation and temperature rise analysis for nanocutting sapphire workpiece with quasi-steady molecular statics method Lin, Z.-C.;Hsu, Y.-C.
國立臺灣科技大學 2013 Establishment and analysis of tapping mode atomic force microscopy simulative measurement model affected by external environment vibration Lin, Z.-C.;Chou, M.-H.
國立臺灣科技大學 2013 Investigation of the abrasive removal depth for bowl-shaped structure of sapphire wafer under compensated chemical mechanical polishing Lin, Z.C.;Wang, R.Y.

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