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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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"lin z c"的相關文件
顯示項目 21-45 / 220 (共9頁) 1 2 3 4 5 6 7 8 9 > >> 每頁顯示[10|25|50]項目
| 國立交通大學 |
2014-12-08T15:15:56Z |
Transmission electron microscopy studies of GaAs nanostructures in InGaAs/InP matrix grown by molecular beam epitaxy
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Lin, S. D.; Lin, Z. C.; Lee, C. P. |
| 國立交通大學 |
2014-12-08T15:14:39Z |
Mobility asymmetry in InGaAs/InAlAs heterostructures with InAs quantum wires
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Lin, Z. C.; Hsieh, W. H.; Lee, C. P.; Suen, Y. W. |
| 國立交通大學 |
2014-12-08T15:12:46Z |
Ordering of stacked InAs/GaAs quantum-wires in InAlAs/InGaAs matrix on (100) InP substrates
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Lin, Z. C.; Lin, S. D.; Lee, C. P. |
| 國立臺灣科技大學 |
2014 |
Abrasive removal depth for polishing a sapphire wafer by a cross-patterned polishing pad with different abrasive particle sizes
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Lin, Z.-C.;Wang, R.-Y. |
| 國立臺灣科技大學 |
2014 |
Simulation of temperature field during nanoscale orthogonal cutting of single-crystal silicon by molecular statics method
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Lin, Z.-C.;Lin, M.-H.;Hsu, Y.-C. |
| 國立臺灣科技大學 |
2014 |
Fabrication method and experiment study of nanoscale trapezoidal groove on sapphire substrate by using atomic force microscope under a fixed cutting depth and changed down force
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Lin, Z.-C.;Tsai, J.-S.;Hsu, Y.-C.;Lin, C.-T. |
| 國立臺灣科技大學 |
2014 |
A study of simulation of three-dimensional quasi-steady molecular statics nanoscale orthogonal cutting of single-crystal silicon material having rows of atoms with vacancy defect
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Lin, Z.-C.;Jian, C.-S.;Wang, R.-Y. |
| 國立臺灣科技大學 |
2013 |
Simulation and temperature rise analysis for nanocutting sapphire workpiece with quasi-steady molecular statics method
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Lin, Z.-C.;Hsu, Y.-C. |
| 國立臺灣科技大學 |
2013 |
Establishment and analysis of tapping mode atomic force microscopy simulative measurement model affected by external environment vibration
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Lin, Z.-C.;Chou, M.-H. |
| 國立臺灣科技大學 |
2013 |
Investigation of the abrasive removal depth for bowl-shaped structure of sapphire wafer under compensated chemical mechanical polishing
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Lin, Z.C.;Wang, R.Y. |
| 國立臺灣科技大學 |
2012 |
Analysis on the temperature rise produced by plastic deformation heat for nanoscale orthogonal cutting of copper workpiece
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Lin, Z.-C.;Hsu, Y.-C.;Chen, L.-K. |
| 國立臺灣科技大學 |
2012 |
A grey weighting density-based clustering algorithm for LAO wafer defect inspection
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Huang, M.-L.;Tsai, M.-J.;Chen, C.C.;Lin, S.C.;Lin, Z.C. |
| 國立臺灣科技大學 |
2012 |
A calculating method for the fewest cutting passes on sapphire substrate at a certain depth using specific down force energy with an AFM probe
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Lin, Z.-C.;Hsu, Y.-C. |
| 國立臺灣科技大學 |
2012 |
A study of material removal amount of sapphire wafer in application of chemical mechanical polishing with different polishing pads
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Lin, Z.-C.;Huang, W.-S.;Tsai, J.-S. |
| 國立臺灣科技大學 |
2012 |
Analytical study of simulated nanoscale abrasive cutting of sapphire substrate by three dimensional quasi-steady molecular statics
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Lin, Z.-C.;Wang, R.-Y. |
| 國立臺灣科技大學 |
2012 |
A study of combining molecular statics with heat transfer finite difference method for nanoscale orthogonal cutting of copper
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Lin, Z.-C.;Hsu, Y.-C. |
| 國立臺灣科技大學 |
2012 |
A study of estimating cutting depth for multi-pass nanoscale cutting by using atomic force microscopy
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Lin, Z.-C.;Hsu, Y.-C. |
| 國立臺灣科技大學 |
2012 |
LED English patents analysis using term segmentation and word segmentation system approach
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Lin, Z.-C.;Lin, W.-H.;Du, C.-H. |
| 國立臺灣科技大學 |
2012 |
Analysis on simulation of quasi-steady molecular statics nanocutting model and calculation of temperature rise during orthogonal cutting of single-crystal copper
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Lin, Z.-C.;Hsu, Y.-C. |
| 南亞技術學院 |
2011-05 |
Curve fabrication model analysis of near-field photolithography
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Lin, Z-C; Yang, C-B |
| 國立臺灣科技大學 |
2011 |
Simulation Analysis and Experiment Study of Nanocutting with AFM Probe on the Surface of Sapphire Substrate by Using Three Dimensional Quasi-steady Molecular Statics Nanocutting Model
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Lin, Z.C.;Hsu, Y.C. |
| 國立臺灣科技大學 |
2011 |
Measurement Simulation of Nanoscale Semicircle Profile by Constant-Amplitude Tapping Mode Atomic Force Microscopy (TM-AFM) and Influence of Probe Shape on Scanning Profile
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Lin, Z.C.;Huang, J.J. |
| 國立臺灣科技大學 |
2011 |
Binary Image Analysis and the Stress Analysis of Wafer of Compensated Chemical Mechanical Polishing (CCMP)
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Lin, Z.C.;Lee, Y.H. |
| 國立臺灣科技大學 |
2011 |
Establishment of a Near-Field Photolithography Processing Experiment Prediction Model and Parameter Optimization Model
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Lin, Z.C.;Yang, C.B. |
| 國立臺灣科技大學 |
2011 |
Curve fabrication model analysis of near-field photolithography
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Lin, Z.C.;Yang, C.B. |
顯示項目 21-45 / 220 (共9頁) 1 2 3 4 5 6 7 8 9 > >> 每頁顯示[10|25|50]項目
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