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Showing items 166-168 of 168  (7 Page(s) Totally)
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Institution Date Title Author
國立成功大學 2001-11 Characterization and reliability of low dielectric constant fluorosilicate glass and silicon rich oxide process for deep sub-micron device application Cheng, Y. L.; Wang, Ying-Lang; Liu, C. W.; Wu, Y. L.; Lo, Kuang-Yao; Liu, Chuan-Pu; Lan, J. K.
國立成功大學 2001-11 Integration of MOCVD titanium nitride with collimated titanium and ion metal plasma titanium for 0.18-mu m logic process Lan, J. K.; Wang, Ying-Lang; Lo, Kuang-Yao; Liu, Chuan-Pu; Liu, C. W.; Wang, JK; Cheng, Y. L.; Chau, C. G.
國立成功大學 2001-04 High-angle annular dark-field imaging of self-assembled Ge islands on Si(001) Liu, Chuan-Pu; Twesten, R. D.; Gibson, J. Murray

Showing items 166-168 of 168  (7 Page(s) Totally)
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