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| 臺大學術典藏 |
2010 |
Halo profile engineering to reduce Vt fluctuation in high-K/metal-gate nMOSFET
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Chen, W.-Y.;Yu, T.-H.;Ohtou, T.;Sheu, Y.-M.;Wu, J.;Liu, C.; Chen, W.-Y.; Yu, T.-H.; Ohtou, T.; Sheu, Y.-M.; Wu, J.; Liu, C.; CHEE-WEE LIU |
| 臺大學術典藏 |
2010 |
Halo profile engineering to reduce Vt fluctuation in high-K/metal-gate nMOSFET
|
Chen, W.-Y.;Yu, T.-H.;Ohtou, T.;Sheu, Y.-M.;Wu, J.;Liu, C.; Chen, W.-Y.; Yu, T.-H.; Ohtou, T.; Sheu, Y.-M.; Wu, J.; Liu, C.; CHEE-WEE LIU |
Showing items 1-2 of 2 (1 Page(s) Totally)
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