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Showing items 11-20 of 121 (13 Page(s) Totally)
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| 中山醫學大學 |
2020 |
Flavonoids Identification and Pancreatic Beta-Cell Protective Effect of Lotus Seedpod
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Lee, MS; Chyau, CC; Wang, CP; Wang, TH; Chen, JH; Lin, HH |
| 中山醫學大學 |
2020 |
Structural Validity of an ICF-Based Measure of Activity and Participation for Children in Taiwan's Disability Eligibility Determination System
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Hwang, AW; Yen, CF; Liao, HF; Chi, WC; Liou, TH; Chang, BS; Wu, TF; Kang, LJ; Lu, SJ; Simeonsson, RJ; Wang, TH; Bedell, G |
| 國立交通大學 |
2019-04-02T06:04:36Z |
CHARACTERIZATION AND SIMULATION OF HOT CARRIER EFFECT ON ERASING GATE CURRENT IN FLASH EEPROMS
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HUANG, CM; WANG, TH; CHEN, T; PENG, NC; CHANG, A; SHONE, FC |
| 臺大學術典藏 |
2018-09-10T06:47:20Z |
Effective prevention and treatment of Helicobacter pylori infection using a combination of catechins and sialic acid in AGS cells and BALB/c mice
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Yang, JC;Shun, CT;Chien, CT;Wang, TH.; Yang, J.-C. and Shun, C.-T. and Chien, C.-T. and Wang, T.-H.; Yang, JC; JYH-CHIN YANG; CHIA-TUNG SHUN; Shun, CT; Chien, CT; Wang, TH. |
| 國立交通大學 |
2018-08-21T05:53:38Z |
A global pinching theorem for surfaces with constant mean curvature in S-3
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Hsu, YJ; Wang, TH |
| 國立交通大學 |
2014-12-08T15:48:54Z |
Investigation of oxide charge trapping and detrapping in a MOSFET by using a GIDL current technique
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Wang, TH; Chang, TE; Chiang, LP; Wang, CH; Zous, NK; Huang, CM |
| 國立交通大學 |
2014-12-08T15:48:47Z |
Characterization of various stress-induced oxide traps in MOSFET's by using a subthreshold transient current technique
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Wang, TH; Chiang, LP; Zous, NK; Chang, TE; Huang, C |
| 國立交通大學 |
2014-12-08T15:46:18Z |
Transient effects of positive oxide charge on stress-induced leakage current in tunnel oxides
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Zous, NK; Wang, TH; Yeh, CC; Tsai, CW; Huang, CM |
| 國立交通大學 |
2014-12-08T15:46:14Z |
A comprehensive study of hot carrier stress-induced drain leakage current degradation in thin-oxide n-MOSFET's
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Wang, TH; Chiang, LP; Zous, NK; Hsu, CF; Huang, LY; Chao, TS |
| 國立交通大學 |
2014-12-08T15:44:34Z |
Hot carrier reliability improvement by utilizing phosphorus transient enhanced diffusion for input/output devices of deep submicron CMOS technology
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Wang, HCH; Diaz, CH; Liew, BK; Sun, JYC; Wang, TH |
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