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"wu cw"
Showing items 26-35 of 215 (22 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:36:51Z |
Procedures for testing manufacturing precision C(p)based on ((X)over-bar, R) or ((X)over-bar, S) control chart samples
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Pearn, WL; Wu, CW; Chuang, HC |
| 國立交通大學 |
2014-12-08T15:36:50Z |
Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufacturing
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Pearn, WL; Wu, CW; Wang, KH |
| 國立交通大學 |
2014-12-08T15:36:50Z |
Measuring manufacturing capability for couplers and wavelength division multiplexers
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Wu, CW; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:36:10Z |
Process capabitity assessment for index C-pk based on bayesian approach
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Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:34:57Z |
Capability testing based on CPM with multiple samples
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Wu, CW; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:25:45Z |
A Sigma-Delta modulation based analog BIST system with a wide bandwidth fifth-order analog response extractor for diagnosis purpose
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Hong, HC; Wu, CW; Cheng, KT |
| 國立交通大學 |
2014-12-08T15:18:23Z |
A Bayesian approach for assessing process precision based on multiple samples
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Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:17:40Z |
Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of detectives
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Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:16:52Z |
Applications of the Web-based collaborative visualization in distributed product development
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Chu, CH; Cheng, CY; Wu, CW |
| 國立交通大學 |
2014-12-08T15:16:52Z |
Variables sampling plans with PPM fraction of defectives and process loss consideration
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Pearn, WL; Wu, CW |
Showing items 26-35 of 215 (22 Page(s) Totally)
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