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机构 日期 题名 作者
國立交通大學 2014-12-08T15:36:51Z Procedures for testing manufacturing precision C(p)based on ((X)over-bar, R) or ((X)over-bar, S) control chart samples Pearn, WL; Wu, CW; Chuang, HC
國立交通大學 2014-12-08T15:36:50Z Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufacturing Pearn, WL; Wu, CW; Wang, KH
國立交通大學 2014-12-08T15:36:50Z Measuring manufacturing capability for couplers and wavelength division multiplexers Wu, CW; Pearn, WL
國立交通大學 2014-12-08T15:36:10Z Process capabitity assessment for index C-pk based on bayesian approach Pearn, WL; Wu, CW
國立交通大學 2014-12-08T15:34:57Z Capability testing based on CPM with multiple samples Wu, CW; Pearn, WL
國立交通大學 2014-12-08T15:25:45Z A Sigma-Delta modulation based analog BIST system with a wide bandwidth fifth-order analog response extractor for diagnosis purpose Hong, HC; Wu, CW; Cheng, KT
國立交通大學 2014-12-08T15:18:23Z A Bayesian approach for assessing process precision based on multiple samples Pearn, WL; Wu, CW
國立交通大學 2014-12-08T15:17:40Z Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of detectives Pearn, WL; Wu, CW
國立交通大學 2014-12-08T15:16:52Z Applications of the Web-based collaborative visualization in distributed product development Chu, CH; Cheng, CY; Wu, CW
國立交通大學 2014-12-08T15:16:52Z Variables sampling plans with PPM fraction of defectives and process loss consideration Pearn, WL; Wu, CW

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