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教育部委托研究计画 计画执行:国立台湾大学图书馆
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"wu cy"的相关文件
显示项目 316-325 / 607 (共61页)
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| 國立交通大學 |
2014-12-08T15:06:05Z |
THE DISTORTION OF THE INTERFACE-STATE SPECTRUM DUE TO NONEQUILIBRIUM OCCUPANCY OF THE INTERFACE STATES AT THE METAL-SEMICONDUCTOR INTERFACE
|
TSENG, HH; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:05Z |
THE EFFECTS OF THERMAL NITRIDATION CONDITIONS ON THE RELIABILITY OF THIN NITRIDED OXIDE-FILMS
|
TSAI, HH; WU, LC; WU, CY; HU, CM |
| 國立交通大學 |
2014-12-08T15:06:05Z |
A NEW STRUCTURE-ORIENTED MODEL FOR WELL RESISTANCE IN CMOS LATCHUP STRUCTURES
|
CHEN, MJ; SZE, SC; CHEN, HH; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:05Z |
A SIMPLE INTERFACIAL-LAYER MODEL FOR THE NONIDEAL IV AND C-V CHARACTERISTICS OF THE SCHOTTKY-BARRIER DIODE
|
TSENG, HH; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:04Z |
AN ANALYTIC IV MODEL FOR LIGHTLY DOPED DRAIN (LDD) MOSFET DEVICES
|
HUANG, GS; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:04Z |
SUPERIOR CHARACTERISTICS OF THERMAL OXIDE LAYERS GROWN ON AMORPHOUS-SILICON FILMS
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WU, CY; CHEN, CF |
| 國立交通大學 |
2014-12-08T15:06:03Z |
A NEW APPROACH TO ANALYTICALLY SOLVING THE TWO-DIMENSIONAL POISSON EQUATION AND ITS APPLICATION IN SHORT-CHANNEL MOSFET MODELING
|
LIN, PS; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:03Z |
A SIMPLIFIED COMPUTER-ANALYSIS FOR NORMAL-WELL GUARD RING EFFICIENCY IN CMOS CIRCUITS
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CHEN, MJ; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:03Z |
THE DIELECTRIC RELIABILITY OF INTRINSIC THIN SIO2-FILMS THERMALLY GROWN ON A HEAVILY DOPED SI SUBSTRATE - CHARACTERIZATION AND MODELING
|
CHEN, CF; WU, CY; LEE, MK; CHEN, CN |
| 國立交通大學 |
2014-12-08T15:06:03Z |
TRANSPORT-PROPERTIES OF THERMAL OXIDE-FILMS GROWN ON POLYCRYSTALLINE SILICON - MODELING AND EXPERIMENTS
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WU, CY; CHEN, CF |
显示项目 316-325 / 607 (共61页)
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