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Institution Date Title Author
中國文化大學 2018-01 Experimental location of damage in microelectronic solder joints after a board level reliability evaluation Wu, IC (Wu, I-Chih); Wang, MH (Wang, Min-Haw); Jang, LS (Jang, Ling-Sheng)
中國文化大學 2018 Characteristics of Lock-in Thermography Signal from Solder Bump Cracking in Wafer-level Chip Scale Packaging for Internet of Things Applications Wu, IC (Wu, I-Chih); Huang, YJ (Huang, Yu-Jung); Wang, MH (Wang, Min-Haw); Jang, LS (Jang, Ling-Sheng)

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