English  |  正體中文  |  简体中文  |  Total items :0  
Visitors :  51266361    Online Users :  693
Project Commissioned by the Ministry of Education
Project Executed by National Taiwan University Library
 
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
About TAIR

Browse By

News

Copyright

Related Links

"wu sl"

Return to Browse by Author
Sorting by Title Sort by Date

Showing items 26-35 of 82  (9 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 9 > >>
View [10|25|50] records per page

Institution Date Title Author
國立交通大學 2014-12-08T15:04:48Z CHARACTERIZATION OF ULTRATHIN OXIDE PREPARED BY LOW-TEMPERATURE WAFER LOADING AND NITROGEN PREANNEALING BEFORE OXIDATION WU, SL; LEE, CL; LEI, TF; LIANG, MS
國立交通大學 2014-12-08T15:04:37Z ELECTRICAL CHARACTERISTICS OF TEXTURED POLYSILICON OXIDE PREPARED BY A LOW-TEMPERATURE WAFER LOADING AND N-2 PREANNEALING PROCESS WU, SL; LIN, TY; LEE, CL; LEI, TF
國立交通大學 2014-12-08T15:04:29Z ULTRATHIN TEXTURED POLYCRYSTALLINE OXIDE WITH A HIGH ELECTRON CONDUCTION EFFICIENCY PREPARED BY THERMAL-OXIDATION OF THIN POLYCRYSTALLINE SILICON FILM ON N+ POLYCRYSTALLINE SILICON WU, SL; LEE, CL; LEI, TF
國立交通大學 2014-12-08T15:04:26Z ELECTRICAL CHARACTERISTICS OF A STACKED NITRIDE MICROCRYSTALLINE-SILICON OXIDE SILICON STRUCTURE WU, SL; LEE, CL; LEI, TF
國立交通大學 2014-12-08T15:04:25Z TUNNEL OXIDE PREPARED BY THERMAL-OXIDATION OF THIN POLYSILICON FILM ON SILICON (TOPS) WU, SL; LEE, CL; LEI, TF
國立交通大學 2014-12-08T15:04:19Z CHARACTERISTICS OF POLYSILICON CONTACTED SHALLOW JUNCTION DIODE FORMED WITH A STACKED-AMORPHOUS-SILICON FILM WU, SL; LEE, CL; LEI, TF; CHANG, HC
國立交通大學 2014-12-08T15:04:16Z THIN OXIDE GROWN ON HEAVILY CHANNEL-IMPLANTED SUBSTRATE BY USING A LOW-TEMPERATURE WAFER LOADING AND N2 PRE-ANNEALING PROCESS WU, SL; LEE, CL; LEI, TF
國立交通大學 2014-12-08T15:04:04Z ENHANCEMENT OF OXIDE BREAK-UP BY IMPLANTATION OF FLUORINE IN POLY-SI EMITTER CONTACTED P-+-N SHALLOW JUNCTION FORMATION WU, SL; LEE, CL; LEI, TF; CHEN, CF; CHEN, LJ; HO, KZ; LING, YC
國立交通大學 2014-12-08T15:04:01Z SUPPRESSION OF THE BORON PENETRATION INDUCED SI/SIO2 INTERFACE DEGRADATION BY USING A STACKED-AMORPHOUS-SILICON FILM AS THE GATE STRUCTURE FOR PMOSFET WU, SL; LEE, CL; LEI, TF; CHEN, JF; CHEN, LJ
國立交通大學 2014-12-08T15:03:54Z SYNTHESIS AND X-RAY-DIFFRACTION OF FERROELECTRIC LIQUID-CRYSTALLINE POLYSILOXANES CONTAINING 4'-(2-CHLORO-3-METHYL-PENTANOYLOXY)-4-ALKANYLOXYBIPHENYL SIDE-GROUPS HSIUE, GH; HSIEH, PJ; WU, SL; HSU, CS

Showing items 26-35 of 82  (9 Page(s) Totally)
<< < 1 2 3 4 5 6 7 8 9 > >>
View [10|25|50] records per page