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Showing items 341-350 of 372 (38 Page(s) Totally)
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| 國立臺灣大學 |
2004 |
Experimental investigation of ozone accumulation overnight during a wintertime ozone episode in south Taiwan
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Lin, C. H.; Wu, Y. L.; Lai, C. H.; Lin, P. H.; Lai, H. C.; Lin, P. L. |
| 國立成功大學 |
2003-01-15 |
Integration of a stack of two fluorine doped silicon oxide film with ULSI interconnect metallization
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Cheng, Y. L.; Wang, Y. L.; Liu, Chuan-Pu; Wu, Y. L.; Lo, K. Y.; Liu, C. W.; Lan, J. K.; Ay, Chyung; Feng, M. S. |
| 國立成功大學 |
2001-11 |
Characterization and reliability of low dielectric constant fluorosilicate glass and silicon rich oxide process for deep sub-micron device application
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Cheng, Y. L.; Wang, Ying-Lang; Liu, C. W.; Wu, Y. L.; Lo, Kuang-Yao; Liu, Chuan-Pu; Lan, J. K. |
| 國立臺灣大學 |
2001 |
CP violating phase γ from a global fit of rare charmless hadronic B decays
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He, X.-G.; Hsiao, Y.-K.; Shi, J.-Q.; Wu, Y.-L.; Zhou, Y.-F. |
| 淡江大學 |
2000-10 |
Tree-Structured LFSR synthesis scheme for pseudo-exhaustive testing of VLSI circuits
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Rau, Jiann-chyi; Jone, W.B.; Chang, S.C.; Wu, Y.L. |
| 臺北醫學大學 |
1998 |
The Influence of Transient and Strong Load on Periodontium.
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李勝揚; Wu C-H; Su C-Y; Wu Y-L; Chang W-J; Hsu K-D; Lee S-Y |
| 國立臺灣大學 |
1995 |
Improvement in Reliability of n-MOSFETs by Using Rapid Thermal N20- Reoxidized Gate Oxides
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胡振國; Wu, Y. L.; Wu, Z. Y.; Hwu, Jenn-Gwo; Wu, Y. L.; Wu, Z. Y. |
| 臺大學術典藏 |
1995 |
Intrathoracic goiter with superior vena cava syndrome and tracheal compression. A case report
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Lee Y.-C.; Luh S.-P.; Wu Y.-L.; JANG-MING LEE; Tai H.-C.; Tai H.-C.;Wu Y.-L.;Jang-Ming Lee;Luh S.-P.;Lee Y.-C. |
| 國立臺灣大學 |
1994 |
Subaortic Blind Mitral Pouch in a Double-Inlet Right Ventricle
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邱英世; Wu, Y. L.; Chen, M. R.; Chen, B. F.; Chiu, Ing-Sh; Wu, Y. L.; Chen, M. R.; Chen, B. F. |
| 國立臺灣大學 |
1994 |
Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings
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胡振國; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M. |
Showing items 341-350 of 372 (38 Page(s) Totally)
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