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机构	日期	题名	作者
國立臺灣大學	2004	Experimental investigation of ozone accumulation overnight during a wintertime ozone episode in south Taiwan	Lin, C. H.; Wu, Y. L.; Lai, C. H.; Lin, P. H.; Lai, H. C.; Lin, P. L.
國立成功大學	2003-01-15	Integration of a stack of two fluorine doped silicon oxide film with ULSI interconnect metallization	Cheng, Y. L.; Wang, Y. L.; Liu, Chuan-Pu; Wu, Y. L.; Lo, K. Y.; Liu, C. W.; Lan, J. K.; Ay, Chyung; Feng, M. S.
國立成功大學	2001-11	Characterization and reliability of low dielectric constant fluorosilicate glass and silicon rich oxide process for deep sub-micron device application	Cheng, Y. L.; Wang, Ying-Lang; Liu, C. W.; Wu, Y. L.; Lo, Kuang-Yao; Liu, Chuan-Pu; Lan, J. K.
國立臺灣大學	2001	CP violating phase γ from a global fit of rare charmless hadronic B decays	He, X.-G.; Hsiao, Y.-K.; Shi, J.-Q.; Wu, Y.-L.; Zhou, Y.-F.
淡江大學	2000-10	Tree-Structured LFSR synthesis scheme for pseudo-exhaustive testing of VLSI circuits	Rau, Jiann-chyi; Jone, W.B.; Chang, S.C.; Wu, Y.L.
臺北醫學大學	1998	The Influence of Transient and Strong Load on Periodontium.	李勝揚; Wu C-H; Su C-Y; Wu Y-L; Chang W-J; Hsu K-D; Lee S-Y
國立臺灣大學	1995	Improvement in Reliability of n-MOSFETs by Using Rapid Thermal N20- Reoxidized Gate Oxides	胡振國; Wu, Y. L.; Wu, Z. Y.; Hwu, Jenn-Gwo; Wu, Y. L.; Wu, Z. Y.
臺大學術典藏	1995	Intrathoracic goiter with superior vena cava syndrome and tracheal compression. A case report	Lee Y.-C.; Luh S.-P.; Wu Y.-L.; JANG-MING LEE; Tai H.-C.; Tai H.-C.;Wu Y.-L.;Jang-Ming Lee;Luh S.-P.;Lee Y.-C.
國立臺灣大學	1994	Subaortic Blind Mitral Pouch in a Double-Inlet Right Ventricle	邱英世; Wu, Y. L.; Chen, M. R.; Chen, B. F.; Chiu, Ing-Sh; Wu, Y. L.; Chen, M. R.; Chen, B. F.
國立臺灣大學	1994	Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings	胡振國; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M.
國立臺灣大學	1994	Characterization of Metal-Oxide-Semiconductor Capacitors with Improved Gate Oxides Prepared by Repeated Rapid Thermal Annealings in N20	胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L.
國立臺灣大學	1994	Design of Radiation Hard CMOS Circuits by Changing Aspect Ratios and Adding Compensation Resistors	胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L.
國立臺灣大學	1994	Effect of Starting Oxide Preparation on Electrical Properties of Reoxidized Nitrided and N20-Annealed Gate Oxides	胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L.
國立臺灣大學	1994	Improvement in Radiation Hardness of Gate Oxides in Metal-Oxide- Semiconductor Devices by Repeated Rapid Thermal Oxidations in N20	胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L.
國立臺灣大學	1994	Reduction of Radiation-Induced Degradation in N-Channel Metal-Oxide- Semiconductor Field-Effect Transistors (MOSFET's) with Gate Oxides Prepared by Repeated Rapid Thermal N20 Annealing	胡振國; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M.
國立臺灣大學	1994	Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings	胡振國; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M.
國立臺灣大學	1994	Serological Responses of Patients with Nasopharyngeal Carcinoma to an N-Terminal Epstein-Barr Virus DNA Polymerase Expressed in Procaryotic Cells	Liu, M. Y.; Wu, Y. L.; Chen, L. S.; 陳振陽; Yang, C. S.; Liu, M. Y.; Wu, Y. L.; Chen, L. S.; Chen, Jan-Yang; Yang, C. S.
臺大學術典藏	1994	Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings	Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; 胡振國; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M.
臺大學術典藏	1994	Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings	Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; 胡振國; Wu, Y. L.; Kuo, K. M.
國立臺灣大學	1993	Right Pulmonary Artery Arising from Ascending Aorta:Report of a Successfully Treated Case	邱英世; Siy, L. L; Chen, M. R.; Lee, B. S.; Chiu, C. B.; Wu, Y. L.; Chiu, Ing-Sh; Siy, L. L; Chen, M. R.; Lee, B. S.; Chiu, C. B.; Wu, Y. L.
國立臺灣大學	1993	Improved Gate Oxide Reliability by Repeated N20 Rapid Thermal Annealings	胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L.
國立臺灣大學	1993	Improved Performance of n-MOSFET's with Reoxidized Nitrided Oxide (RNO) by Using N20 as the Reoxidizer	胡振國; Wu, Z. Y.; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Z. Y.; Wu, Y. L.
國立臺灣大學	1993	Improvement in Radiation Hardness of Reoxidized Nitrided Oxide (RNO) in the Absence of Post-Oxidation Anneal	胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L.
國立臺灣大學	1993	Improved Performance of n-MOSFET's with Reoxidized Nitrided Oxide (RNO) by Using N20 as the Reoxidizer	胡振國; Wu, Z. Y.; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Z. Y.; Wu, Y. L.
臺大學術典藏	1993	Improved Performance of n-MOSFET's with Reoxidized Nitrided Oxide (RNO) by Using N20 as the Reoxidizer	Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Z. Y.; 胡振國; Wu, Z. Y.; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Z. Y.

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