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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立交通大學 2019-04-02T05:59:28Z AN EFFICIENT PRECLEAN OF ALUMINIZED SILICON SUBSTRATE FOR CHEMICAL-VAPOR-DEPOSITION OF SUBMICRON TUNGSTEN PLUGS YEH, WK; TSAI, MH; CHEN, SH; CHEN, MC; WANG, PJ; LIU, LM; LIN, MS
國立交通大學 2019-04-02T05:59:09Z Thermal stability of W-contacted junction diodes Yeh, WK; Chan, KY; Chang, TC; Chen, MC; Lin, MS
國立交通大學 2019-04-02T05:59:08Z Chemical mechanical polishing for selective CVD-W Wang, MT; Yeh, WK; Tsai, MS; Tseng, WT; Chang, TC; Chen, LJ; Chen, MC
國立交通大學 2019-04-02T05:58:28Z Photoluminescence from ordered and disordered Si-SiGe superlattices Chang, TC; Yeh, WK; Mei, YJ; Tsai, WC; Chen, YF
國立交通大學 2017-04-21T06:56:10Z Chemical mechanical polishing for selective CVD-W Wang, MT; Yeh, WK; Tsai, MS; Tseng, WT; Chang, TC; Chen, LJ; Chen, MC
國立交通大學 2017-04-21T06:55:33Z Chemical mechanical polishing for selective CVD-W Wang, MT; Yeh, WK; Tsai, MS; Tseng, WT; Chang, TC; Chen, LJ; Chen, MC
國立交通大學 2014-12-08T15:44:25Z The effects of super-steep-retrograde indium channel profile on deep submicron n-channel metal-oxide-semiconductor field-effect transistor Chen, CM; Chang, SJ; Chou, JW; Lin, T; Yeh, WK; Chang, CY; Luo, WZ; Lee, YJ; Chao, TS; Huang, TY
國立交通大學 2014-12-08T15:41:39Z Hot-carrier-induced degradation for partially depleted SOI 0.25-0.1 mu m CMOSFET with 2-nm thin gate oxide Yeh, WK; Wang, WH; Fang, YK; Chen, MC; Yang, FL
國立交通大學 2014-12-08T15:39:26Z Efficient improvement of hot-carrier-induced device's degradation for sub-0.1 mu m complementary metal-oxide-semiconductor field-effect-transistor technology Lin, JC; Yeh, WK; Lei, TF
國立交通大學 2014-12-08T15:39:26Z Low-frequency noise in partially depleted SOI MOSFETs operating from linear region to saturation region at various temperatures Chen, KM; Hu, HH; Huang, GW; Yeh, WK; Chang, CY

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