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"yeh wk"的相关文件
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| 國立交通大學 |
2019-04-02T05:59:28Z |
AN EFFICIENT PRECLEAN OF ALUMINIZED SILICON SUBSTRATE FOR CHEMICAL-VAPOR-DEPOSITION OF SUBMICRON TUNGSTEN PLUGS
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YEH, WK; TSAI, MH; CHEN, SH; CHEN, MC; WANG, PJ; LIU, LM; LIN, MS |
| 國立交通大學 |
2019-04-02T05:59:09Z |
Thermal stability of W-contacted junction diodes
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Yeh, WK; Chan, KY; Chang, TC; Chen, MC; Lin, MS |
| 國立交通大學 |
2019-04-02T05:59:08Z |
Chemical mechanical polishing for selective CVD-W
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Wang, MT; Yeh, WK; Tsai, MS; Tseng, WT; Chang, TC; Chen, LJ; Chen, MC |
| 國立交通大學 |
2019-04-02T05:58:28Z |
Photoluminescence from ordered and disordered Si-SiGe superlattices
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Chang, TC; Yeh, WK; Mei, YJ; Tsai, WC; Chen, YF |
| 國立交通大學 |
2017-04-21T06:56:10Z |
Chemical mechanical polishing for selective CVD-W
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Wang, MT; Yeh, WK; Tsai, MS; Tseng, WT; Chang, TC; Chen, LJ; Chen, MC |
| 國立交通大學 |
2017-04-21T06:55:33Z |
Chemical mechanical polishing for selective CVD-W
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Wang, MT; Yeh, WK; Tsai, MS; Tseng, WT; Chang, TC; Chen, LJ; Chen, MC |
| 國立交通大學 |
2014-12-08T15:44:25Z |
The effects of super-steep-retrograde indium channel profile on deep submicron n-channel metal-oxide-semiconductor field-effect transistor
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Chen, CM; Chang, SJ; Chou, JW; Lin, T; Yeh, WK; Chang, CY; Luo, WZ; Lee, YJ; Chao, TS; Huang, TY |
| 國立交通大學 |
2014-12-08T15:41:39Z |
Hot-carrier-induced degradation for partially depleted SOI 0.25-0.1 mu m CMOSFET with 2-nm thin gate oxide
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Yeh, WK; Wang, WH; Fang, YK; Chen, MC; Yang, FL |
| 國立交通大學 |
2014-12-08T15:39:26Z |
Efficient improvement of hot-carrier-induced device's degradation for sub-0.1 mu m complementary metal-oxide-semiconductor field-effect-transistor technology
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Lin, JC; Yeh, WK; Lei, TF |
| 國立交通大學 |
2014-12-08T15:39:26Z |
Low-frequency noise in partially depleted SOI MOSFETs operating from linear region to saturation region at various temperatures
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Chen, KM; Hu, HH; Huang, GW; Yeh, WK; Chang, CY |
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