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"yeh wk"的相關文件
顯示項目 1-28 / 28 (共1頁) 1 每頁顯示[10|25|50]項目
| 國立交通大學 |
2019-04-02T05:59:28Z |
AN EFFICIENT PRECLEAN OF ALUMINIZED SILICON SUBSTRATE FOR CHEMICAL-VAPOR-DEPOSITION OF SUBMICRON TUNGSTEN PLUGS
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YEH, WK; TSAI, MH; CHEN, SH; CHEN, MC; WANG, PJ; LIU, LM; LIN, MS |
| 國立交通大學 |
2019-04-02T05:59:09Z |
Thermal stability of W-contacted junction diodes
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Yeh, WK; Chan, KY; Chang, TC; Chen, MC; Lin, MS |
| 國立交通大學 |
2019-04-02T05:59:08Z |
Chemical mechanical polishing for selective CVD-W
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Wang, MT; Yeh, WK; Tsai, MS; Tseng, WT; Chang, TC; Chen, LJ; Chen, MC |
| 國立交通大學 |
2019-04-02T05:58:28Z |
Photoluminescence from ordered and disordered Si-SiGe superlattices
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Chang, TC; Yeh, WK; Mei, YJ; Tsai, WC; Chen, YF |
| 國立交通大學 |
2017-04-21T06:56:10Z |
Chemical mechanical polishing for selective CVD-W
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Wang, MT; Yeh, WK; Tsai, MS; Tseng, WT; Chang, TC; Chen, LJ; Chen, MC |
| 國立交通大學 |
2017-04-21T06:55:33Z |
Chemical mechanical polishing for selective CVD-W
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Wang, MT; Yeh, WK; Tsai, MS; Tseng, WT; Chang, TC; Chen, LJ; Chen, MC |
| 國立交通大學 |
2014-12-08T15:44:25Z |
The effects of super-steep-retrograde indium channel profile on deep submicron n-channel metal-oxide-semiconductor field-effect transistor
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Chen, CM; Chang, SJ; Chou, JW; Lin, T; Yeh, WK; Chang, CY; Luo, WZ; Lee, YJ; Chao, TS; Huang, TY |
| 國立交通大學 |
2014-12-08T15:41:39Z |
Hot-carrier-induced degradation for partially depleted SOI 0.25-0.1 mu m CMOSFET with 2-nm thin gate oxide
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Yeh, WK; Wang, WH; Fang, YK; Chen, MC; Yang, FL |
| 國立交通大學 |
2014-12-08T15:39:26Z |
Efficient improvement of hot-carrier-induced device's degradation for sub-0.1 mu m complementary metal-oxide-semiconductor field-effect-transistor technology
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Lin, JC; Yeh, WK; Lei, TF |
| 國立交通大學 |
2014-12-08T15:39:26Z |
Low-frequency noise in partially depleted SOI MOSFETs operating from linear region to saturation region at various temperatures
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Chen, KM; Hu, HH; Huang, GW; Yeh, WK; Chang, CY |
| 國立交通大學 |
2014-12-08T15:39:22Z |
Efficient improvement of hot carrier-induced degradation for 0.1-mu m indium-halo nMOSFET
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Yeh, WK; Lin, JC |
| 國立交通大學 |
2014-12-08T15:39:08Z |
The effect of thermal treatment on device characteristic and reliability for sub-100-nm CMOSFETs
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Yeh, WK; Fang, YK; Chen, MC |
| 國立交通大學 |
2014-12-08T15:27:38Z |
Thermal stability and interaction between SiOF and Cu film
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Mei, YJ; Chang, TC; Sheu, JD; Yeh, WK; Pan, FM; Chang, CY |
| 國立交通大學 |
2014-12-08T15:27:37Z |
Anomalous selective tungsten growth by chemical vapor deposition
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Mei, YJ; Chang, TC; Sheu, JD; Yeh, WK; Pan, FM; Chang, CY |
| 國立交通大學 |
2014-12-08T15:03:10Z |
AN EFFICIENT PRECLEAN OF ALUMINIZED SILICON SUBSTRATE FOR CHEMICAL-VAPOR-DEPOSITION OF SUBMICRON TUNGSTEN PLUGS
|
YEH, WK; TSAI, MH; CHEN, SH; CHEN, MC; WANG, PJ; LIU, LM; LIN, MS |
| 國立交通大學 |
2014-12-08T15:03:01Z |
Selective tungsten CVD on submicron contact hole
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Yeh, WK; Chen, MC; Wang, PJ; Liu, LM; Lin, MS |
| 國立交通大學 |
2014-12-08T15:03:01Z |
Thermal stability of AlSiCu/W/n(+)p diodes with and without TiN barrier layer
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Yeh, WK; Chen, MC; Wang, PJ; Liu, LM; Lin, MS |
| 國立交通大學 |
2014-12-08T15:02:59Z |
Effect of surface pretreatment of submicron contact hole on selective tungsten chemical vapor deposition
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Yeh, WK; Chen, MC; Lin, MS |
| 國立交通大學 |
2014-12-08T15:02:53Z |
Light emission from the porous boron delta-doped Si superlattice
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Chang, TC; Yeh, WK; Hsu, MY; Chang, CY; Lee, CP; Jung, TG; Tsai, WC; Huang, GW; Mei, YJ |
| 國立交通大學 |
2014-12-08T15:02:53Z |
An efficient improvement for barrier effect of W-filled contact
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Yeh, WK; Chan, KY; Chang, TC; Tsai, MH; Chen, SH; Chen, MC; Lin, MS |
| 國立交通大學 |
2014-12-08T15:02:52Z |
Disordered Si/SiGe superlattices grown by ultrahigh vacuum chemical vapor deposition
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Chang, TC; Yeh, WK; Chang, CY; Jung, TG; Tsai, WC; Huang, GW; Mei, YJ |
| 國立交通大學 |
2014-12-08T15:02:45Z |
Characterization of diamond films grown on amorphous SiO2
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Chen, CF; Leu, SY; Chen, SH; Yeh, WK |
| 國立交通大學 |
2014-12-08T15:02:43Z |
Uniformity of epilayer grown by ultrahigh-vacuum chemical vapor deposition
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Chang, TC; Yeh, WK; Chang, CY; Jung, TG; Tsai, WC; Huang, GW; Mei, YJ |
| 國立交通大學 |
2014-12-08T15:02:38Z |
Thermal stability of W-contacted junction diodes
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Yeh, WK; Chan, KY; Chang, TC; Chen, MC; Lin, MS |
| 國立交通大學 |
2014-12-08T15:02:22Z |
Deposition properties of selective tungsten chemical vapor deposition
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Yeh, WK; Chen, MC; Wang, PJ; Liu, LM; Lin, MS |
| 國立交通大學 |
2014-12-08T15:02:21Z |
Photoluminescence from ordered and disordered Si-SiGe superlattices
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Chang, TC; Yeh, WK; Mei, YJ; Tsai, WC; Chen, YF |
| 國立交通大學 |
2014-12-08T15:02:10Z |
A new tungsten gate metal oxide semiconductor capacitor using a chemical vapor deposition process
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Yeh, WK; Shiau, YC; Chen, MC |
| 國立交通大學 |
2014-12-08T15:01:23Z |
Chemical mechanical polishing for selective CVD-W
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Wang, MT; Yeh, WK; Tsai, MS; Tseng, WT; Chang, TC; Chen, LJ; Chen, MC |
顯示項目 1-28 / 28 (共1頁) 1 每頁顯示[10|25|50]項目
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