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Institution Date Title Author
元智大學 2011-06 A Fast Gibbs Sampler Approach to Identify Tool Combinations for Semiconductor Manufacturing Yield Diagnosis Yu-Chin Hsu; Chih-Min Fan; Yun-Pei Lu
元智大學 2009-08 A Bayesian Ranking Scheme for Supporting Cost-Effective Yield Diagnosis Services 范治民; Yun-Pei Lu
元智大學 2008-12 A Bayesian Framework to Integrate Knowledge-Based and Data-Driven Inference Tools for Reliable Yield Diagnosis 范治民; Yun-Pei Lu
元智大學 2008 整合統計分析與知識推論系統的貝氏架構設計 -以半導體良率分析為例 呂芸霈; Yun-Pei Lu

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