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Showing items 374946-374970 of 2310013 (92401 Page(s) Totally)
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| 國立中山大學 |
2002 |
Electrical characteristics of ultrathin Pt/Y2O3/Si capacitor with rapid post-metallization annealing
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T.S. Lay;W.D. Liu;J. Kwo;M. Hong;J.P. Mannaerts |
| 臺大學術典藏 |
2019-12-27T07:49:53Z |
Electrical characteristics of ultrathin Pt/Y2O3/Si capacitor with rapid post-metallisation annealing
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Lay, T.S.;Liu, W.D.;Kwo, J.;Hong, M.;Mannaerts, J.P.; Lay, T.S.; Liu, W.D.; Kwo, J.; Hong, M.; Mannaerts, J.P.; MINGHWEI HONG |
| 國立交通大學 |
2014-12-08T15:04:21Z |
ELECTRICAL CHARACTERISTICS OF WO3-BASED CO2-SENSITIVE SOLID-STATE MICROSENSOR
|
CHAO, S |
| 國立交通大學 |
2014-12-08T15:32:15Z |
Electrical Characterization and Materials Stability Analysis of La2O3/HfO2 Composite Oxides on n-In0.53Ga0.47As MOS Capacitors With Different Annealing Temperatures
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Lin, Yueh Chin; Trinh, Hai Dang; Chuang, Ting Wei; Iwai, Hiroshi; Kakushima, Kuniyuki; Ahmet, Parhat; Lin, Chun Hsiung; Diaz, Carlos H.; Chang, Hui Chen; Jang, Simon M.; Chang, Edward Yi |
| 國立臺灣大學 |
2003 |
Electrical Characterization and Process Control of Cost Effective High-k Aluminum Oxide Gate Dielectrics Prepared by Anodization Followed by Furnace Annealing
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Huang, Szu-Wei; Hwu, Jenn-Gwo |
| 國立交通大學 |
2014-12-08T15:20:45Z |
Electrical characterization and Raman spectroscopy of individual vanadium pentoxide nanowire
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Shen, W. -J.; Sun, K. W.; Lee, C. S. |
| 國立中山大學 |
1997 |
Electrical characterization and signal integrity of ball grid array packages
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T.S. Horng;S.M. Wu;M.J. Kuo |
| 國立交通大學 |
2014-12-08T15:07:41Z |
Electrical Characterization and Transmission Electron Microscopy Assessment of Isolation of AlGaN/GaN High Electron Mobility Transistors with Oxygen Ion Implantation
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Shiu, Jin-Yu; Lu, Chung-Yu; Su, Ting-Yi; Huang, Rong-Tan; Zirath, Herbert; Rorsman, Niklas; Chang, Edward Yi |
| 國立臺灣海洋大學 |
2010-02 |
Electrical Characterization and Transmission Electron Microscopy Assessment of Isolation of AlGaN/GaN High Electron Mobility Transistors with Oxygen Ion Implantation
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Jin-Yu Shiu; Chung-Yu Lu; Ting-Yi Su; R. T. Huang; Herbert Zirath; Niklas Rorsman; Edward Yi Chang |
| 國立交通大學 |
2014-12-08T15:33:42Z |
Electrical Characterization of Al(2)O(3)/n-InAs Metal-Oxide-Semiconductor Capacitors With Various Surface Treatments
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Trinh, H. D.; Brammertz, G.; Chang, E. Y.; Kuo, C. I.; Lu, C. Y.; Lin, Y. C.; Nguyen, H. Q.; Wong, Y. Y.; Tran, B. T.; Kakushima, K.; Iwai, H. |
| 國立交通大學 |
2014-12-08T15:46:38Z |
Electrical characterization of Al2O3 on Si from thermally oxidized AlAs and Al
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Liao, CC; Chin, A; Tsai, C |
| 國立交通大學 |
2019-04-02T05:58:46Z |
Electrical Characterization of Al2O3/n-InAs Metal-Oxide-Semiconductor Capacitors With Various Surface Treatments
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Trinh, H. D.; Brammertz, G.; Chang, E. Y.; Kuo, C. I.; Lu, C. Y.; Lin, Y. C.; Nguyen, H. Q.; Wong, Y. Y.; Tran, B. T.; Kakushima, K.; Iwai, H. |
| 臺大學術典藏 |
2018-09-10T04:53:28Z |
Electrical characterization of arsenic-ion-implanted semi-insulating GaAs by current-voltage measurement
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Lin, G.-R.;Chen, W.-C.;Chang, C.-S.;Pan, C.-L.; Lin, G.-R.; Chen, W.-C.; Chang, C.-S.; Pan, C.-L.; GONG-RU LIN |
| 臺大學術典藏 |
2020-06-11T06:38:11Z |
Electrical characterization of arsenic-ion-implanted semi-insulating GaAs by current-voltage measurement
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Lin, G.-R.;Chen, W.-C.;Chang, C.-S.;Pan, C.-L.; Lin, G.-R.; Chen, W.-C.; Chang, C.-S.; Pan, C.-L.; GONG-RU LIN |
| 國立交通大學 |
2014-12-08T15:03:39Z |
ELECTRICAL CHARACTERIZATION OF ARSENIC-ION-IMPLANTED SEMIINSULATING GAAS BY CURRENT-VOLTAGE MEASUREMENT
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LIN, GR; CHEN, WC; CHANG, CS; PAN, CL |
| 國立交通大學 |
2014-12-08T15:12:24Z |
Electrical characterization of bathophenanthroline doped with dipotassium phthalate
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Hsieh, Ming-Ta; Chang, Chan-Ching; Chen, Jenn-Fang; Ho, Meng-Huan; Chen, Teng-Ming; Chen, Chao-Jung; Chen, Chin H. |
| 義守大學 |
2002-12 |
Electrical characterization of BGA test socket for high-speed applications
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Ming-Kun Chen;Cheng-Chi Tai;Yu-Jung Huang;Li-Kuei Fang |
| 義守大學 |
2006-10 |
Electrical characterization of FCBGA package based on measurement approach for high-speed SOC applications
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Ming-Kun Chen;Cheng-Chi Tai;Yu-Jung Huang |
| 國立交通大學 |
2014-12-08T15:01:52Z |
Electrical characterization of fine-pitch compliant bumps
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Lin, C. K.; Chen, Chih; Chang, Shyh-Ming; An, Chao-Chyun; Lee, Hsiao Ting; Kao, Kuo-Shu; Tsang, Jimmy; Yang, Sheng-Shu |
| 國立交通大學 |
2014-12-08T15:19:49Z |
Electrical characterization of fine-pitch compliant bumps
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Lin, C. K.; Chen, Chih; Chang, Shyh-Ming; An, Chao-Chyun; Lee, Hsiao Ting; Kao, Kuo-Shu; Tsang, Jimmy; Yang, Sheng-Shu |
| 東海大學 |
2009 |
Electrical Characterization of High-k Anodic Aluminum Oxide Gate Dielectrics on Gallium Nitride Substrate MOS Capacitors
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龔 正 |
| 國立高雄大學 |
2008 |
Electrical Characterization of Microelectromechanical Silicon Carbide Resonators
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文騰,張 |
| 國立彰化師範大學 |
2007-11 |
Electrical Characterization of Ni/Au Schottky Barrier on P-type GaN Based on Transmission Line Model
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Lin, Yow-Jon |
| 國立交通大學 |
2014-12-08T15:11:02Z |
Electrical characterization of organic light-emitting diodes using dipotassium phthalate as n-type dopant
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Ho, Meng-Huan; Hsieh, Ming-Ta; Chen, Teng-Ming; Chen, Jenn-Fang; Hwang, Shiao-Wen; Chen, Chin H. |
| 國立臺灣科技大學 |
2019 |
Electrical characterization of RF reactive sputtered p-Mg-InxGa1-xN/n-Si Hetero-Junction Diodes without using Buffer Layer
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Tuan, Tuan T.T.A.;Kuo, D.-H.;Cao, P.T.;Nguyen, V.S.;Pham, Q.-P.;Nghi, V.K.;Tran, N.P.L. |
Showing items 374946-374970 of 2310013 (92401 Page(s) Totally)
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View [10|25|50] records per page
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