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教育部委托研究计画 计画执行:国立台湾大学图书馆
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显示项目 397526-397535 / 2348511 (共234852页) << < 39748 39749 39750 39751 39752 39753 39754 39755 39756 39757 > >> 每页显示[10|25|50]项目
| 國立交通大學 |
2014-12-08T15:11:24Z |
ESD protection design with on-chip ESD bus and high-voltage-tolerant ESD clamp circuit for mixed-voltage I/O buffers
|
Ker, Ming-Dou; Chang, Wei-Jen |
| 國立交通大學 |
2017-04-21T06:55:35Z |
ESD Protection Design With Stacked High-Holding-Voltage SCR for High-Voltage Pins in a Battery-Monitoring IC
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Dai, Chia-Tsen; Ker, Ming-Dou |
| 國立交通大學 |
2017-04-21T06:50:10Z |
ESD Protection Design with Stacked Low-Voltage Devices for High-Voltage Pins of Battery-Monitoring IC
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Dai, Chia-Tsen; Ker, Ming-Dou |
| 國立交通大學 |
2014-12-08T15:26:55Z |
ESD protection strategy for sub-quarter-micron CMOS technology: Gate-driven design versus substrate-triggered design
|
Chen, TY; Ker, MD |
| 國立交通大學 |
2014-12-16T06:15:12Z |
ESD PROTECTION STRUCTURE FOR 3D IC
|
Chen Kuan-Neng; Lai Ming-Fang; Chen Hung-Ming |
| 國立交通大學 |
2014-12-08T15:25:32Z |
ESD protection structure with embedded high-voltage p-type SCR for automotive vacuum-fluorescent-display (VFD) applications
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Ker, MD; Chang, WJ; Yang, M; Chen, CC; Chan, MC; Shieh, WT; Yen, KL |
| 國立交通大學 |
2014-12-08T15:28:05Z |
ESD Protection Structure with Inductor-Triggered SCR for RF Applications in 65-nm CMOS Process
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Lin, Chun-Yu; Chu, Li-Wei; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Chang, Tzu-Heng |
| 國立交通大學 |
2014-12-08T15:43:41Z |
ESD protection under grounded-up bond pads in 0.13 mu m eight-level copper metal, fluorinated silicate glass low-k intermetal dielectric CMOS process technology
|
Chou, KY; Chen, MJ |
| 大葉大學 |
2000 |
ESD robustness designs of power MOSFET ICs
|
陳勝利 |
| 大葉大學 |
2000-11 |
ESD Robustness Designs of Power MOSFET ICs
|
陳勝利 |
显示项目 397526-397535 / 2348511 (共234852页) << < 39748 39749 39750 39751 39752 39753 39754 39755 39756 39757 > >> 每页显示[10|25|50]项目
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