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"huang ty"的相關文件
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| 國立交通大學 |
2014-12-08T15:48:56Z |
Improving radiation hardness of EEPROM/flash cell by N2O annealing
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Huang, TY; Jong, FC; Chao, TS; Lin, HC; Leu, LY; Young, K; Lin, CH; Chiu, KY |
| 國立交通大學 |
2014-12-08T15:48:55Z |
Comparison of N-2 and NH3 plasma passivation effects on polycrystalline silicon thin-film transistors
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Lee, YS; Lin, HY; Lei, TF; Huang, TY; Chang, TC; Chang, CY |
| 國立交通大學 |
2014-12-08T15:47:36Z |
Improvement of reliability of metal-oxide semiconductor field-effect transistors with N2O nitrided gate oxide and N2O polysilicon gate reoxidation
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Lai, CS; Chao, TS; Lei, TF; Lee, CL; Huang, TY; Chang, CY |
| 國立交通大學 |
2014-12-08T15:47:03Z |
The effects of shallow germanium halo doping on N-channel metal oxide semiconductor field effect transistors
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Wang, MF; Chien, CH; Chao, TS; Lin, HC; Jong, FC; Huang, TY; Chang, CY |
| 國立交通大學 |
2014-12-08T15:46:47Z |
Oxide thickness dependence of plasma charging damage
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Lin, HC; Chen, CC; Wang, MF; Hsien, SK; Chien, CH; Huang, TY; Chang, CY |
| 國立交通大學 |
2014-12-08T15:46:43Z |
Leakage current reduction of chemical-vapor-deposited Ta2O5 films on rugged polycrystalline silicon electrode for dynamic random access memory application
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Lin, M; Chang, CY; Huang, TY; Shieh, WY |
| 國立交通大學 |
2014-12-08T15:46:37Z |
Reliability of ultrathin gate oxides for ULSI devices
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Chang, CY; Chen, CC; Lin, HC; Liang, MS; Chien, CH; Huang, TY |
| 國立交通大學 |
2014-12-08T15:46:29Z |
Temperature-accelerated dielectric breakdown in ultrathin gate oxides
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Chen, CC; Chang, CY; Chien, CH; Huang, TY; Lin, HC; Liang, MS |
| 國立交通大學 |
2014-12-08T15:46:25Z |
Highly (111) textured titanium nitride layers for sub- quarter-micrometer Al metallization
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Wu, WF; Lin, CC; Huang, CC; Lin, HC; Chang, TC; Yang, RP; Huang, TY |
| 國立交通大學 |
2014-12-08T15:46:20Z |
A novel lightly doped drain polysilicon thin-film transistor with oxide sidewall spacer formed by one-step selective liquid phase deposition
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Shih, PS; Chang, CY; Chang, TC; Huang, TY; Peng, DZ; Yeh, CF |
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