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Institution Date Title Author
國立交通大學 2014-12-08T15:25:32Z ESD protection structure with embedded high-voltage p-type SCR for automotive vacuum-fluorescent-display (VFD) applications Ker, MD; Chang, WJ; Yang, M; Chen, CC; Chan, MC; Shieh, WT; Yen, KL
國立交通大學 2014-12-08T15:28:05Z ESD Protection Structure with Inductor-Triggered SCR for RF Applications in 65-nm CMOS Process Lin, Chun-Yu; Chu, Li-Wei; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Chang, Tzu-Heng
國立交通大學 2014-12-08T15:43:41Z ESD protection under grounded-up bond pads in 0.13 mu m eight-level copper metal, fluorinated silicate glass low-k intermetal dielectric CMOS process technology Chou, KY; Chen, MJ
大葉大學 2000 ESD robustness designs of power MOSFET ICs 陳勝利
大葉大學 2000-11 ESD Robustness Designs of Power MOSFET ICs 陳勝利
國立成功大學 2024 ESD Robustness of Germanium Photodetectors in Advanced Silicon Photonics Technology Chen;S, -H.;Fu;P, -Y.;Tsiara;A;Peer, van de;M;Simicic;M;Musibau;S;Ban;Y;Kao;K, -H.;Chen;W, -C.;Serbulova;K;Campenhout, Van;J;Absil;P;Croes;K
國立交通大學 2014-12-08T15:15:20Z ESD robustness of thin-film devices with different layout structures in LTPS technology Deng, Chih-Kang; Ker, Ming-Dou
國立交通大學 2017-04-21T06:48:20Z ESD Self-Protection Design on 2.4-GHz T/R Switch for RF Application in CMOS Process Lin, Chun-Yu; Liu, Rui-Hong; Ker, Ming-Dou
亞洲大學 2010-10 ESD Simulation on GGNMOS for 40V BCD 許健;Sheu, Gene;楊紹明;Yang, Shao-Ming
國立交通大學 2014-12-08T15:26:50Z ESD test methods on integrated circuits: An overview Ker, MD; Peng, JH; Jiang, HC

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