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教育部委托研究计画 计画执行:国立台湾大学图书馆
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显示项目 397536-397545 / 2348570 (共234857页)
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| 國立交通大學 |
2014-12-08T15:25:32Z |
ESD protection structure with embedded high-voltage p-type SCR for automotive vacuum-fluorescent-display (VFD) applications
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Ker, MD; Chang, WJ; Yang, M; Chen, CC; Chan, MC; Shieh, WT; Yen, KL |
| 國立交通大學 |
2014-12-08T15:28:05Z |
ESD Protection Structure with Inductor-Triggered SCR for RF Applications in 65-nm CMOS Process
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Lin, Chun-Yu; Chu, Li-Wei; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Chang, Tzu-Heng |
| 國立交通大學 |
2014-12-08T15:43:41Z |
ESD protection under grounded-up bond pads in 0.13 mu m eight-level copper metal, fluorinated silicate glass low-k intermetal dielectric CMOS process technology
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Chou, KY; Chen, MJ |
| 大葉大學 |
2000 |
ESD robustness designs of power MOSFET ICs
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陳勝利 |
| 大葉大學 |
2000-11 |
ESD Robustness Designs of Power MOSFET ICs
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陳勝利 |
| 國立成功大學 |
2024 |
ESD Robustness of Germanium Photodetectors in Advanced Silicon Photonics Technology
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Chen;S, -H.;Fu;P, -Y.;Tsiara;A;Peer, van de;M;Simicic;M;Musibau;S;Ban;Y;Kao;K, -H.;Chen;W, -C.;Serbulova;K;Campenhout, Van;J;Absil;P;Croes;K |
| 國立交通大學 |
2014-12-08T15:15:20Z |
ESD robustness of thin-film devices with different layout structures in LTPS technology
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Deng, Chih-Kang; Ker, Ming-Dou |
| 國立交通大學 |
2017-04-21T06:48:20Z |
ESD Self-Protection Design on 2.4-GHz T/R Switch for RF Application in CMOS Process
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Lin, Chun-Yu; Liu, Rui-Hong; Ker, Ming-Dou |
| 亞洲大學 |
2010-10 |
ESD Simulation on GGNMOS for 40V BCD
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許健;Sheu, Gene;楊紹明;Yang, Shao-Ming |
| 國立交通大學 |
2014-12-08T15:26:50Z |
ESD test methods on integrated circuits: An overview
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Ker, MD; Peng, JH; Jiang, HC |
显示项目 397536-397545 / 2348570 (共234857页)
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每页显示[10|25|50]项目
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