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Showing items 216031-216040 of 2351408 (235141 Page(s) Totally) << < 21599 21600 21601 21602 21603 21604 21605 21606 21607 21608 > >> View [10|25|50] records per page
| 元智大學 |
2005-08 |
Automatic defect inspection for LCDs using singular value decomposition
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C. J. Lu (呂奇傑); 蔡篤銘 |
| 元智大學 |
2006-10 |
Automatic defect inspection of patterned TFT-LCD panels using Fourier image reconstruction
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蔡篤銘; Su-Ta Chuang; Yan-Hsin Tseng |
| 元智大學 |
2005-11 |
Automatic defect inspection of patterned thin film transistor-liquid crystal display (TFT-LCD) panels using one-dimensional Fourier reconstruction and wavelet decomposition
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蔡篤銘; C. Y. Hung (洪崇祐) |
| 元智大學 |
2014-10-12 |
Automatic defect inspection of TFT-LCD panels using Fourier image reconstruction
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Du-Ming Tsai; Yan-Hsin Tseng; Wei-Yao Chiu |
| 國立臺灣科技大學 |
2013 |
Automatic defect inspection system of colour filters using Taguchi-based neural network
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Kuo, C.-F.;Hsu, C.-T.M.;Fang, C.-H.;Chao, S.-M.;Lin, Y.-D. |
| 元智大學 |
2002-12 |
Automatic defect inspectoin for LCDs using singular value decomposition
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蔡篤銘; Chi-Jie Lu; Hus-Nan Yen |
| 國立交通大學 |
2014-12-08T15:36:16Z |
Automatic defect recognition of TFT array process using gray level co-occurrence matrix
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Yang, Shih-Wei; Lin, Chern-Sheng; Lin, Shir-Kuan; Chiang, Hsien-Te |
| 國立交通大學 |
2017-04-21T06:49:26Z |
Automatic Defense Through Fault Localization and Dynamic Patch Creation
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Chen, Hsia-Hsiang; Zheng, Da-Qun; Huang, Shih-Kun |
| 淡江大學 |
2016-08 |
Automatic Defense through Fault Localization and Dynamic Patch Creation
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Chen, Hsia-Hsiang;Zheng, Da-Qun;Huang, Shih-Kun |
| 國立成功大學 |
2021 |
Automatic Deployment Mechanism for Smart Communication Service Based on Container Technology
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Chen, S.-L.;Chuang, H.-Y. |
Showing items 216031-216040 of 2351408 (235141 Page(s) Totally) << < 21599 21600 21601 21602 21603 21604 21605 21606 21607 21608 > >> View [10|25|50] records per page
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