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Institution	Date	Title	Author
國立交通大學	2019-04-02T06:04:27Z	Back to the Future: Germanium nanoengineering reemerges as the savior of Si functional devices	Li, Pei-Wen
淡江大學	2016/8/16	Back to the future: Instability of the Sino-Japan relationship in the 21st Century	Liao, Hsiao-chuan
國立成功大學	2021	Back-Bias Modulated UTBB SOI for System-on-Chip I/O Cells	Chang, M.-Y.;Chao, P.-Y.;Chiang, M.-H.
國立成功大學	2016-10	Back-calculating strength parameters and predicting displacements of deep-seated sliding surface comprising weathered rocks	Huang, Ching-Chuan
國立交通大學	2019-04-02T06:04:16Z	Back-Channel Etched Double Layer In-W-O/In-W-Zn-O Thin-Film Transistors	Li, Zhen-Hao; Kuo, Po-Yi; Chen, Wen-Tzu; Liu, Po-Tsun
國立成功大學	2021-08	Back-contact perovskite solar cells	Lin;Chen-Fu;Lin;Tai-Fu;Li;Ming-Hsien;Lin;Pei-Ying;Raifuku;Itaru;Hsieh;Po-Tsung;Chen;Peter
國立交通大學	2018-08-21T05:56:42Z	Back-Contacted Thin-Film GaAs Solar Cells	Hong, Chung-Yu; Lin, Yu-Chen; Ho, Kuan-Ying; Tsai, Jia-Ling; Chien, Zhan-Tien; Wu, Yuh-Renn; Lin, Albert; Uen, Wu-Yih; Chi, Gou-Chung; Yu, Peichen
國立成功大學	2017-11	Back-diffusion plasma generator for ionosphere study	Fang;H, K.;Oyama;K-I;Chen;A, B.
臺大學術典藏	2018-09-10T09:50:54Z	Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM	BC Bai;C-L Hsu;MH Wu;CA Chen;YW Chen;KL Luo;LC Cheng;JCM Li; BC Bai; C-L Hsu; MH Wu; CA Chen; YW Chen; KL Luo; LC Cheng; JCM Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:50:25Z	Back-Gate Bias Effect of PD SOI NMOS Device Considering BJT	D. H. Lung;J. B. Kuo; D. H. Lung; J. B. Kuo; JAMES-B KUO

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