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Showing items 231751-231775 of 2347236 (93890 Page(s) Totally) << < 9266 9267 9268 9269 9270 9271 9272 9273 9274 9275 > >> View [10|25|50] records per page
| 義守大學 |
2004 |
BRCA1、雌激素接受體及DNA修復蛋白在乳癌所扮演的角色
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袁行修;侯明峰 |
| 義守大學 |
2006 |
BRCA1、雌激素接受體及DNA修復蛋白的相互作用在乳癌所扮演的角色
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袁行修;侯明鋒 |
| 臺北醫學大學 |
1999 |
BRCA1及BRCA2抑癌基因與乳癌危險因子之互動探討
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陳品玲;楊沂淵;張金堅 |
| 國立成功大學 |
2014-07-26 |
BRCC3調控腦膠質瘤細胞生長與替莫唑胺之抗藥性
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蔡潔雯; Chai, Kit-Man |
| 國立成功大學 |
2014-07-04 |
BRCC3調控腦膠質瘤細胞生長與替莫唑胺之抗藥性
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蔡潔雯; Chai, Kit Man |
| 國立成功大學 |
2024-07-25 |
BRD2 和 BRD4 在 DNA 複製壓力的機制
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林廷恩; Lin, Ting-En |
| 國立成功大學 |
2025-01-21 |
BRD4在複製壓力下參與複製叉保護機制
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陳雅均; Chen, Ya-Jun |
| 中國文化大學 |
2006 |
Breadth and depth of English vocabulary knowledge : which really matters in the academic reading performance of Chinese University students?
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Hsing-Fei Huang撰 |
| 臺北醫學大學 |
1989 |
break down the wall
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臺北醫學大學 |
| 佛光大學 |
1998 |
Break Point Detection by K-curvature
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田方治; 駱至中; 劉季旋 |
| 建國科技大學 |
2010 |
BREAK PREDICTION OF PROSODY FOR HAKKA’S TTS SYSTEMS BASED ON DATA MINING APPROACHES
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潘能煌 |
| 臺大學術典藏 |
2018-09-10T06:28:22Z |
Break-junction tunneling measurements of the high-T c superconductor Y 1 Ba 2 Cu 3 O 9- $δ$
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Ekin, JW;Goodrich, LF;Capobianco, TE;Clark, AF;Kwo, J;Hong, M; Morel; , John; Ekin, JW; Goodrich, LF; Capobianco, TE; Clark, AF; Kwo, J; Hong, M; Liou, Sy\\_Hwang; MINGHWEI HONG |
| 臺大學術典藏 |
2018-09-10T06:28:15Z |
Break-junction tunneling measurements of the high-T/sub c/superconductor Y 1 Ba 2 Cu 3 O/sub 9-//sub $δ$
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Morel;, J;Ekin, JW;Goodrich, LF;Capobianco, TE;Clark, AF;Kwo, J;Hong, M;Liou, SH; Morel; , J; Ekin, JW; Goodrich, LF; Capobianco, TE; Clark, AF; Kwo, J; Hong, M; Liou, SH; MINGHWEI HONG |
| 臺大學術典藏 |
2018-09-10T06:28:16Z |
Break-junction tunneling measurements of the high-T/sub c/superconductor Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 9-//sub delta
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Morel;, J;Ekin, JW;Goodrich, LF;Capobianco, TE;Clark, AF;Kwo, J;Hong, M;Liou, SH; Morel; , J; Ekin, JW; Goodrich, LF; Capobianco, TE; Clark, AF; Kwo, J; Hong, M; Liou, SH; MINGHWEI HONG |
| 臺大學術典藏 |
2021-08-05T02:37:10Z |
Breakage behavior of gravel rock particles under impact force
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Zhao H;Liu C;Zhang J;Ge L.; Zhao H; Liu C; Zhang J; Ge L.; YU-NING GE |
| 臺北市立大學 |
2005 |
Breakdown analysis on distributed group communication
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Wei, W.J.; 魏惠貞; Lee, L.C. |
| 中國文化大學 |
2010-12 |
Breakdown and Reformation of the Intertropical Convergence Zone in a Moist Atmosphere
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Wang, CC (Wang, Chia-Chi); Chou, C (Chou, Chia); Lee, WL (Lee, We-Liang) |
| 國立臺灣大學 |
2010 |
Breakdown and reformation of the intertropical convergence zone in a moist atmosphere
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Wang, Chia-Chi; Chou, Chia; Lee, We-Liang |
| 國立聯合大學 |
2004 |
Breakdown and reliability of p-MOS devices with stacked RPECVD oxide/nitride gate dielectric under constant voltage stress
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李宜穆, Y. Wu and G. Lucovsky |
| 國立成功大學 |
2002-11 |
Breakdown and stress-induced oxide degradation mechanisms in MOSFETs
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Chen, J. H.; Wei, C. T.; Hung, S. M.; Wong, Shyh-Chyi; Wang, Yeong-Her |
| 國立臺灣大學 |
2008 |
Breakdown Behavior of 40-nm PD-SOI NMOS Device Considering STI-Induced Mechanical Stress Effect
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Su, V.C.; Lin, I.S.; Kuo, J.B.; Lin, G.S.; Chen, D.; Yeh, C.S.; Tsai, C.T.; Ma, M. |
| 臺大學術典藏 |
2018-09-10T07:08:18Z |
Breakdown Behavior of 40-nm PD-SOI NMOS Device Considering STI-Induced Mechanical Stress Effect
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I. S. Lin;V. C. Su;J. B. Kuo;D. Chen;C. S. Yeh;C. T. Tsai;M. Ma; I. S. Lin; V. C. Su; J. B. Kuo; D. Chen; C. S. Yeh; C. T. Tsai; M. Ma; JAMES-B KUO |
| 亞洲大學 |
2023 |
Breakdown Behavior of a Nitrogen Implanted AlGaN/GaN HEMT Transistor with different Metal Contact Positions
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RAMYASRI, MOGARALA |
| 國立高雄師範大學 |
2001 |
Breakdown Characteristics of Ultra-thin Gate Oxide ( < 4nm ) in MOS Structure Subjected Substrate Injection
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Chia-Hong Huang;Jenn-Gwo Hwu; 黃嘉宏 |
| 國立交通大學 |
2014-12-08T15:27:09Z |
Breakdown characteristics of ultra-thin gate oxides caused by plasma charging
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Chen, CC; Lin, HC; Chang, CY; Chien, CH; Huang, TY |
Showing items 231751-231775 of 2347236 (93890 Page(s) Totally) << < 9266 9267 9268 9269 9270 9271 9272 9273 9274 9275 > >> View [10|25|50] records per page
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