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Institution Date Title Author
國立臺灣大學 1987 Degradation and Annealing Characteristics of Amorphous Silicon Hydrogen Alloys After Long Time Test Tzeng, W. J.; Tsai, H. K.; 李嗣涔; Tzeng, W. J.; Tsai, H. K.; Lee, Si-Chen
淡江大學 1987-09 Degradation and annealing characteristics of amorphous silicon-hydrogen alloys after a long-time test Tzeng, W.J.; 曾文哲; Tsai, H.K.; Lee, Si-chen
臺大學術典藏 2020-06-11T06:23:02Z Degradation and annealing characteristics of amorphous silicon-hydrogen alloys after a long-time test Tzeng, W.-J.;Tsai, H.-K.;Lee, S.-C.; Tzeng, W.-J.; Tsai, H.-K.; Lee, S.-C.; SI-CHEN LEE
元培科技大學 2014 Degradation and detoxicity of ethylenediamine wastewater by a continuous dosing mode sono-Fenton process Wang, Chi-Kang; Hou, Chien-Wei; Wei, Yu-Xiu
元培科技大學 2015-01 Degradation and detoxification of diazinon by sono-Fenton and sono-Fenton-like processes Wang, Chikang; Shih, Yiheng
國立成功大學 2011-10-30 Degradation and formation of wood odorant beta-cyclocitral during permanganate oxidation Zhang, Ke-jia; Gao, Nai-yun; Yen, Hung-Kai; Chiu, Yi-Ting; Lin, Tsair-Fuh
元智大學 2009-11 Degradation and localized drug release of polyanhydride microspheres and devices 朱一民; Liu, T.H.
臺大學術典藏 2019-05-03T08:51:03Z Degradation and Mineralization of Carbamazepine Using an Electro-Fenton Reaction Catalyzed by Magnetite Nanoparticles Fixed on an Electrocatalytic Carbon Fiber Textile Cathode Hoffmann M.R.;Dong H.;Yu J.C.-C.;Liu K.;Wu J.C.S.; Liu K.; Yu J.C.-C.; Dong H.; Wu J.C.S.; Hoffmann M.R.
國立成功大學 2014-08-10 Degradation and mineralization of pyridine by photo-electro Fenton advanced oxidation process Priambodo, Ricky;Huang, Yao-Hui
國立成功大學 2021 Degradation Behavior of Etch-Stopper-Layer Structured a-InGaZnO Thin-Film Transistors under Hot-Carrier Stress and Illumination Lin, D.;Su, W.-C.;Chang, T.-C.;Chen, H.-C.;Tu, Y.-F.;Zhou, K.-J.;Hung, Y.-H.;Yang, J.;Lu, I.-N.;Tsai, Tsai T.-M.;Zhang, Q.
臺大學術典藏 1991 Degradation Behavior of Normally Consolidated Clay Under Cyclic Loading Condition Lin, Meei-Ling; Chen, Jiang-Yuan; 林美聆; Chen, Jiang-Yuan; Lin, Meei-Ling; Chen, Jiang-Yuan
國立臺灣大學 1991 Degradation Behavior of Normally Consolidated Clay Under Cyclic Loading Condition 林美聆; Chen, Jiang-Yuan; Lin, Meei-Ling; Chen, Jiang-Yuan
國立成功大學 2002-03 Degradation behavior of plasma-sprayed hydroxyapatite-bioactive glass coatings in physiological solution Ding, S. J.; Lin, H. J.; Ju, Chien-Ping; Lin, Jiin-Huey Chern
國立交通大學 2014-12-08T15:15:11Z Degradation behaviors of trigate nanowires poly-si TFTs with NH3 plasma passivation under hot-carrier stress Wu, Yung-Chun; Chang, Ting-Chang; Liu, Po-Tsun; Feng, Li-Wei
國立中山大學 2007 Degradation behaviors of trigate nanowires poly-si TFTs with NH3 plasma passivation under hot-carrier stress Y.C. Wu;T.C. Chang;P.T. Liu;L.W. Fen
臺大學術典藏 2020-02-26T01:33:37Z Degradation behaviour of a new bioceramic: Ca 2 P 2 O 7 with addition of Na 4 P 2 O 7 ·10H 2 O Feng-Huei LinLin, F.-H.;Liao, C.-J.;Chen, K.S.;Sun, J.-S.;Liu, H.-C.; Lin, F.-H.; Liao, C.-J.; Chen, K.S.; Sun, J.-S.; Liu, H.-C.; FENG-HUEI LIN
臺大學術典藏 1997 Degradation behaviour of a new bioceramic: Ca2P2O7 with addition of Na4P2O7 ? 10H2O Liao, Chun-Jen; Chen, Kao Shao; Sun, Jui-Sheng; Liu, Haw-Chang; LinFengHuei; Lin, Feng-Huei; Lin, Feng-Huei;Liao, Chun-Jen;Chen, Kao Shao;Sun, Jui-Sheng;Liu, Haw-Changlinfenghuei
國立臺灣大學 1997 Degradation behaviour of a new bioceramic: Ca2P2O7 with addition of Na4P2O7 ? 10H2O Lin, Feng-Huei; Liao, Chun-Jen; Chen, Kao Shao; Sun, Jui-Sheng; Liu, Haw-Chang
臺大學術典藏 2018-09-10T06:12:29Z Degradation behaviour of a new bioceramic: Ca2P2O7 with addition of Na4P2O7·10H2O Lin, F.-H. and Liao, C.-J. and Chen, K.S. and Sun, J.-S. and Liu, H.-C.; JUI-SHENG SUN
臺大學術典藏 2020-02-07T03:44:00Z Degradation behaviour of a new bioceramic: Ca2P2O7 with addition of Na4P2O7·10H2O Lin F.-H.;Liao C.-J.;Chen K.S.;Jui-Sheng Sun;Liu H.-C.; Lin F.-H.; Liao C.-J.; Chen K.S.; JUI-SHENG SUN; Liu H.-C.
元智大學 2014-05-07 Degradation in all-phosphorescent White OLED with double emitting layer structure Bo-Yen Lin; Tien-Lung Chiu; Chi-Feng Lin; Jiun-Haw Lee
臺大學術典藏 2018-09-10T03:44:49Z Degradation in metal-oxide-semiconductor structure with ultrathin gate oxide due to external compressive stress Hong, C.-C.; Hwu, J.-G.; JENN-GWO HWU
國立臺灣大學 2001 Degradation in Metal-Oxide-Semiconductor Structure with Ultrathin Gate Oxide due to External Compressive Stress Hong, Chao-Chi; Hwu, Jenn-Gwo
國立高雄應用科技大學 2008-02 Degradation induced Variation of LC Transition of Poly( n-undecyl isocyanate) Hsieh, Bi-Zen; Chuang, Hung-Yi; Chao, Liang; Huang, Ying-Jie; Tseng, Po-Hao; Hsieh, Tar-Hwa; Han, Yu-Kai; Ho, Ko-Shan
國立交通大學 2014-12-08T15:12:15Z Degradation induced variation of LC transition of poly(n-undecyl isocyanate) Hsieh, Bi-Zen; Chuang, Hung-Yi; Chao, Liang; Huang, Ying-Jie; Tseng, Po-Hao; Hsieh, Tar-Hwa; Han, Yu-Kai; Ho, Ko-Shan

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