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Institution	Date	Title	Author
臺北醫學大學	2014	Fabrication of metamaterial absorber using polymer brush - gold nanoassemblies for visualizing the reversible pH-responsiveness	Zhou, Gang-Yan;Lee, Ai-Wei;Chang, Jia-Yaw;Huang, Chi-Hsien;Chen, Jem-Kun
臺北醫學大學	2014	Fabrication of metamaterial absorber using polymer brush – gold nanoassemblies for visualizing the reversible pH-responsiveness	Zhou, GY;Lee, AW;Chang, JY;Huang, CH;JK*, Chen
臺北醫學大學	2014	Fabrication of metamaterial absorber using polymer brush – gold nanoassemblies for visualizing the reversible pH-responsiveness	GY, Zhou;AW, Lee;JY, Chang;CH, Huang;JK*, Chen
臺大學術典藏	2019-10-31T07:58:00Z	Fabrication of metrology test structures with helium ion beam direct write	KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:58:01Z	Fabrication of metrology test structures with helium ion beam direct write	KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI
臺大學術典藏	2017	Fabrication of metrology test structures with helium ion beam direct write	Lee, C.-L.; Chien, S.-W.; Chen, S.-Y.; Liu, C.-H.; Tsai, K.-Y.; Li, J.-H.; Shew, B.-Y.; Hong, C.-S.; Lee, C.-T.; JIA-HAN LI
臺大學術典藏	2019-10-31T07:57:58Z	Fabrication of metrology test structures with programmed imperfection using helium ion beam direct write	KUEN-YU TSAI;Jia-Han Li;Kuen-Yu Tsai;Sheng-Wei Chien; Sheng-Wei Chien; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2022-01-03T08:01:06Z	Fabrication of metrology test structures with programmed imperfection using helium ion beam direct write	JIA-HAN LI
臺大學術典藏	2018-09-10T08:18:26Z	Fabrication of metrology test structures with programmed line edge roughness using electron beam direct write	Fu-Min Wang;Kuen-Yu Tsai;Jia-Han Li;Alek C. Chen;Yen-Min Lee;Yu-Tian Shen;Hsin-Hung Cheng;Chieh-Hsiang Kuan; Fu-Min Wang; Kuen-Yu Tsai; Jia-Han Li; Alek C. Chen; Yen-Min Lee; Yu-Tian Shen; Hsin-Hung Cheng; Chieh-Hsiang Kuan; KUEN-YU TSAI
臺大學術典藏	2022-01-03T08:01:17Z	Fabrication of metrology test structures with programmed line edge roughness using electron beam direct write	Fu-Min Wang; Kuen-Yu Tsai; Jia-Han Li; Alek C. Chen; Yen-Min Lee; Yu-Tian Shen; Hsin-Hung Cheng; Chieh-Hsiang Kuan; JIA-HAN LI

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