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Institution Date Title Author
東海大學 2013 Focus-on-Form 教學對促進口語表達正確性之成效研究 田孝一???; Hsiao-i Tien
東海大學 2002 FOCUS-關於自己與無所不在被對待的方式 范峻銘
臺大學術典藏 2021-11-04T03:57:22Z Focused assessment with sonography for trauma Wang, Pei Hsiu; Lin, Hao Yang; PO-YUAN CHANG; WAN-CHING LIEN
臺大學術典藏 2022-09-12T07:55:12Z Focused Assessment with Sonography for Trauma Wang, Pei-Hsiu; HAO-YANG LIN; Chang, Po-Yuan; Lien, Wan-Ching
臺大學術典藏 2018 Focused helium ion beam applications in advanced-node nanolithography R/D Kuen-Yu Tsai*; KUEN-YU TSAI; Sheng-Wei Chien; Chien-Lin Lee; KUEN-YU TSAI;Kuen-Yu Tsai*;Sheng-Wei Chien;Chien-Lin Lee
國立成功大學 2019-07-18 Focused Information Criterion and Model Averaging for Large Panels With a Multifactor Error Structure 林常青; Lin, Chang-Ching; Yin, Shou-Yung; Liu, Chu-An
國立成功大學 2021 Focused Information Criterion and Model Averaging for Large Panels With a Multifactor Error Structure Yin, S.-Y.;Liu, C.-A.;Lin, C.-C.
國立臺灣大學 1984 Focused Ion Beam Microlitography Using an Etch-Stop Process in Galliwn- Doped Silicon 王玉麟; La Marche, P. H.; Levi-Setti, R.; Wang, Yuh-Lin; La Marche, P. H.; Levi-Setti, R.
國立成功大學 2008-04 Focused ion beam milled InGaN/GaN multiple quantum well nanopillars Wu, Shang-En; Hsueh, Tao-Hung; Liu, Chuan-Pu; Sheu, Jinn-Kong; Lai, Wei-Chih; Chang, Shoou-Jinn
國立臺灣大學 1991 Focused Ion Beam Vacuum Lithography of InP with an Native Oxide Resist 王玉麟; Temkin, H.; Harriott, L. R.; Hamm, R. A.; Wang, Yuh-Lin; Temkin, H.; Harriott, L. R.; Hamm, R. A.

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