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Showing items 434086-434095 of 2348134 (234814 Page(s) Totally) << < 43404 43405 43406 43407 43408 43409 43410 43411 43412 43413 > >> View [10|25|50] records per page
| 東海大學 |
2013 |
Focus-on-Form 教學對促進口語表達正確性之成效研究
|
田孝一???; Hsiao-i Tien |
| 東海大學 |
2002 |
FOCUS-關於自己與無所不在被對待的方式
|
范峻銘 |
| 臺大學術典藏 |
2021-11-04T03:57:22Z |
Focused assessment with sonography for trauma
|
Wang, Pei Hsiu; Lin, Hao Yang; PO-YUAN CHANG; WAN-CHING LIEN |
| 臺大學術典藏 |
2022-09-12T07:55:12Z |
Focused Assessment with Sonography for Trauma
|
Wang, Pei-Hsiu; HAO-YANG LIN; Chang, Po-Yuan; Lien, Wan-Ching |
| 臺大學術典藏 |
2018 |
Focused helium ion beam applications in advanced-node nanolithography R/D
|
Kuen-Yu Tsai*; KUEN-YU TSAI; Sheng-Wei Chien; Chien-Lin Lee; KUEN-YU TSAI;Kuen-Yu Tsai*;Sheng-Wei Chien;Chien-Lin Lee |
| 國立成功大學 |
2019-07-18 |
Focused Information Criterion and Model Averaging for Large Panels With a Multifactor Error Structure
|
林常青; Lin, Chang-Ching; Yin, Shou-Yung; Liu, Chu-An |
| 國立成功大學 |
2021 |
Focused Information Criterion and Model Averaging for Large Panels With a Multifactor Error Structure
|
Yin, S.-Y.;Liu, C.-A.;Lin, C.-C. |
| 國立臺灣大學 |
1984 |
Focused Ion Beam Microlitography Using an Etch-Stop Process in Galliwn- Doped Silicon
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王玉麟; La Marche, P. H.; Levi-Setti, R.; Wang, Yuh-Lin; La Marche, P. H.; Levi-Setti, R. |
| 國立成功大學 |
2008-04 |
Focused ion beam milled InGaN/GaN multiple quantum well nanopillars
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Wu, Shang-En; Hsueh, Tao-Hung; Liu, Chuan-Pu; Sheu, Jinn-Kong; Lai, Wei-Chih; Chang, Shoou-Jinn |
| 國立臺灣大學 |
1991 |
Focused Ion Beam Vacuum Lithography of InP with an Native Oxide Resist
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王玉麟; Temkin, H.; Harriott, L. R.; Hamm, R. A.; Wang, Yuh-Lin; Temkin, H.; Harriott, L. R.; Hamm, R. A. |
Showing items 434086-434095 of 2348134 (234814 Page(s) Totally) << < 43404 43405 43406 43407 43408 43409 43410 43411 43412 43413 > >> View [10|25|50] records per page
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