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Institution	Date	Title	Author
臺北醫學大學	2006	Hot water-extracted Lycium barbarum and Rehmannia glutinosa inhibit proliferation and induce apoptosis of hepatocellular carcinoma cells	趙振瑞;蔡雅惠; Chao; JC-J;Chiang; S-W;Wang; C-C;Tsai; Y-H;Wu; M-S;
臺北醫學大學	2006-07	Hot water-extracted Lycium barbarum and Rehmannia glutinosa inhibit proliferation and induce apoptosis of hepatocellular carcinoma cells	è¶æ¯ç
臺大學術典藏	2021-12-05T07:43:52Z	Hot weather and chronic kidney disease of undetermined aetiology in Taiwan: nested case-control study from Changhua Community-based Integrated Screening programme	Jerry Che-Jui Chang; HSIAO-YU YANG
國立成功大學	2000-10	Hot welter separation process for copper and insulating material recovery from electric cable waste	Sheih, Shing-Wen; Tsai, Min-Shing
國立中山大學	2007	Hot Workability of the Mg65Cu20Y10Ag5 Amorphous/ NanoZrO2 Composite Alloy within Supercooled Temperature Region	L.J. Chang;G.R. Fang;Jason S.C. Jang;I.S. Lee;Jacob C. Huang;Chi Y.A. Tsao
淡江大學	2008-08	Hot Zone in a Hydrocyclone for Particles Escape from Overflow	Hsu, Chih-yuan; Wu, Rome-ming
國立成功大學	2009-04	Hot-Carrier and Fowler-Nordheim (FN) Tunneling Stresses on RF Reliability of 40-nm PMOSFETs With and Without SiGe Source/Drain	Tang, Mao-Chyuan; Fang, Yean-Kuen; Chen, David C.; Yeh, Chune-Sin
東海大學	2004	Hot-Carrier Degradation Rate of High-Voltage Lateral Diffused Metal-Oxide-Semiconductor Field-Effect Transistors under Maximum Substrate Current Stress Conditions	Chen, S.-H., Gong, J., Wu, M.-C., Su, A.Y.-K.
國立成功大學	2013-05	Hot-Carrier Effect on Amorphous In-Ga-Zn-O Thin-Film Transistors With a Via-Contact Structure	Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Yu-Te; Liao, Po-Yung; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Chun; Chen, Bo-Wei; Chu, Ann-Kuo; Chou, Cheng-Hsu; Chung, Wang-Cheng; Chang, Jung-Fang
國立交通大學	2014-12-08T15:18:59Z	Hot-carrier effects in p-channel modified Schottky-barrier FinFETs	Lin, CP; Tsui, BY
國立交通大學	2014-12-08T15:39:08Z	Hot-carrier effects on power characteristics of SiGeHBTs	Huang, SY; Chen, KM; Huang, GW; Tseng, HC; Hsu, TL; Chang, CY; Huang, TY
國立交通大學	2014-12-08T15:18:55Z	Hot-carrier induced degradations on RF power characteristics of SiGe heterojunction bipolar transistors	Huang, SY; Chen, KM; Huang, GW; Liang, V; Tseng, HC; Hsu, TL; Chang, CY
國立交通大學	2014-12-08T15:25:51Z	Hot-carrier induced degradations on RF power characteristics of SiGe heterojunction bipolar transistors	Huang, SY; Chen, KM; Huang, GW; Hsu, TL; Tseng, HC; Chang, CY
國立交通大學	2020-02-02T23:55:33Z	Hot-Carrier Injection-Induced Disturb and Improvement Methods in 3D NAND Flash Memory	Lin, Wei-Liang; Tsai, Wen-Jer; Cheng, C. C.; Lu, Chun-Chang; Ku, S. H.; Chang, Y. W.; Wu, Guan-Wei; Liu, Lenvis; Hwang, S. W.; Lu, Tao-Cheng; Chen, Kuang-Chao; Tseng, Tseung-Yuen; Lu, Chih-Yuan
國立交通大學	2014-12-08T15:41:39Z	Hot-carrier-induced degradation for partially depleted SOI 0.25-0.1 mu m CMOSFET with 2-nm thin gate oxide	Yeh, WK; Wang, WH; Fang, YK; Chen, MC; Yang, FL
國立成功大學	2002-12	Hot-carrier-induced degradation for partially depleted SOI 0.25-0.1 mu m CMOSFET with 2-nm thin gate oxide	Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Chen, Mao-Chieh; Yang, Fu-Liang
國立成功大學	2003-04	Hot-carrier-induced degradation on 0.1 mu m partially depleted silicon-on-insulator complementary metal-oxide-semiconductor field-effect-transistor	Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Yang, Fu-Liang
國立彰化師範大學	1993-09	Hot-electron Bistability in Quantum-dot Structures	Goodnick, S. M. ; Wu, Jong-Ching; Wybourne, M. N. ; Smith, Doran D.
臺大學術典藏	1994	Hot-Electron Distribution in Multiple Quantum Well Infrared Photodetectors	Newman, P. G.; Chang, W. H.; Kuan, Chieh-Hsiung; Tsui, D. C.; Choi, K. K.; 管傑雄; Tsui, D. C.; Choi, K. K.; Newman, P. G.; Chang, W. H.; Kuan, Chieh-Hsiung; Tsui, D. C.; Choi, K. K.
國立臺灣大學	1994	Hot-Electron Distribution in Multiple Quantum Well Infrared Photodetectors	管傑雄; Tsui, D. C.; Choi, K. K.; Newman, P. G.; Chang, W. H.; Kuan, Chieh-Hsiung; Tsui, D. C.; Choi, K. K.; Newman, P. G.; Chang, W. H.
國立成功大學	2006-12	Hot-electron effects on AlGaAs/InGaAs/GaAs PHEMTs under accelerated DC stresses	Huang, Hou-Kuei; Wang, Chou-Sern; Houng, Mau-Phon; Wang, Yeong-Her
國立交通大學	2014-12-08T15:44:35Z	Hot-electron relaxation via optical phonon emissions in GaAs/AlxGa1-xAs quantum well structures: dependence upon the alloy composition and barrier width	Sun, KW; Chang, HY; Wang, CM; Wang, SY; Lee, CP
國立交通大學	2014-12-08T15:37:06Z	Hot-electron-induced electron trapping in 0.13 mu m nMOSFETs with ultrathin (EOT=1.6 nm) nitrided gate oxide	Chen, CW; Chien, CH; Perng, TH; Chang, CY
臺北醫學大學	2013	Hot-hole Programmed Sol-gel Derived SONOS-Type Flash Memory	You, Yvonne;Yang, Wen-Luh;You, Hsin-Chiang;Wu, Chi-Chang
臺北醫學大學	2013	Hot-hole Programmed Sol-gel Derived SONOS-Type Flash Memory	You, Yvonne;Yang, Wen-Luh;You, Hsin-Chiang;Wu, Chi-Chang

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