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Showing items 473206-473230 of 2348609 (93945 Page(s) Totally)
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| 國立臺灣大學 |
2010 |
Highly Regioselective Oxybromination in an Aqueous System Using SBA-15 Supported Sulfated Zirconia Catalyst
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Chen, Ai-Jan; Chen, Xiao-Rong; Mou, Chung-Yuan |
| 臺大學術典藏 |
2018-09-10T08:09:45Z |
Highly regioselective oxybromination in an aqueous system using SBA-15 supported sulfated zirconia catalyst
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Chen, A.-J.;Chen, X.-R.;Mou, C.-Y.; Chen, A.-J.; Chen, X.-R.; Mou, C.-Y.; CHUNG-YUAN MOU |
| 臺大學術典藏 |
2020-03-02T07:40:49Z |
Highly regioselective reagents for conjugate reduction of enones, HAl(Ot-Bu)2, HA1(Oi-Pr)2, HAl[N(i-Pr)2]2 and HBI2.
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Ashby, E.C.; Lin, J.J.; JIANG-JEN LIN |
| 國立成功大學 |
2019-04 |
Highly Reliable a-Si:H TFT Gate Driver With Precharging Structure for In-Cell Touch AMLCD Applications
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Lin;Chih-Lung;Lai;Po-Cheng;Lee;Po-Ting;Chen;Bo-Shu;Chang;Jui-Hung;Lin;Yu-Sheng |
| 朝陽科技大學 |
2018-08-16 |
Highly Reliable and Efficient Three-Layer Cloud Dispatching Architecture in the Heterogeneous Cloud Computing Environment
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黃永發;Mao-Lun Chiang, Hui-Ching Hsieh and Wen-Chung Tsai |
| 臺大學術典藏 |
2019-12-27T06:48:18Z |
Highly Reliable and Sensitive Tactile Transistor Memory
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Chen, C.-T.; Chen, C.-T.; YANG-FANG CHEN et al. |
| 國立成功大學 |
2016-06 |
Highly Reliable Bidirectional a-InGaZnO Thin-Film Transistor Gate Driver Circuit for High-Resolution Displays
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Lin, Chih-Lung; Wu, Chia-En; Chen, Fu-Hsing; Lai, Po-Cheng; Cheng, Mao-Hsun |
| 國立交通大學 |
2014-12-08T15:43:42Z |
Highly reliable chemical-mechanical polishing process for organic low-k methylsilsesquioxane
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Liu, PT; Chang, TC; Huang, MC; Tsai, MS; Sze, SM |
| 國立交通大學 |
2019-12-13T01:12:52Z |
Highly Reliable Four-Point Bending Test Using Stealth Dicing Method for Adhesion Evaluation
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Yang, Yi-Lun; Liu, Jia-Ling; Chen, Guan Wei; Kodama, Shoichi; Kobinata, Kyosuke; Chen, Kuan-Neng; Ito, Hiroyuki; Kim, Young Suk; Ohba, Takayuki |
| 國立交通大學 |
2014-12-08T15:38:46Z |
Highly reliable GaN-based light-emitting diodes formed by p-In0.1Ga0.9N-ITO structure
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Chang, KM; Chu, JY; Cheng, CC |
| 國立成功大學 |
2007-11 |
Highly reliable high-brightness GaN-based flip chip LEDs
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Chang, Shoou-Jinn; Chen, W. S.; Shei, Shih-Chang; Ko, T. K.; Shen, C. F.; Hsu, Y. P.; Chang, C. S.; Tsai, J. M.; Lai, W. C.; Lin, A. J. |
| 國立交通大學 |
2014-12-08T15:12:04Z |
Highly reliable integrated amorphous silicon thin film transistors gate driver
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Liu, Chin-Wei; Tai, Ya-Hsiang |
| 國立成功大學 |
2012-05 |
Highly Reliable Integrated Gate Driver Circuit for Large TFT-LCD Applications
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Lin, Chih-Lung; Cheng, Mao-Hsun; Tu, Chun-Da; Chuang, Min-Chin |
| 國立交通大學 |
2014-12-08T15:27:13Z |
Highly reliable liquid-phase deposited SiO2 with nitrous oxide plasma post-treatment for low temperature processed poly-Si TFT's
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Yeh, CF; Chen, DC; Lu, CY; Liu, C; Lee, ST; Liu, CH; Chen, TJ |
| 國立交通大學 |
2014-12-08T15:41:55Z |
Highly reliable liquid-phase-deposited SiO2 with nitrous oxide plasma post-treatment for low-temperature-processed polysilicon thin film transistors
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Yeh, CF; Chen, DCH; Lu, CY; Liu, C; Lee, ST; Liu, CH; Chen, TJ |
| 國立交通大學 |
2017-04-21T06:48:54Z |
Highly reliable MA BE-SONOS (Metal-Al2O3 bandgap engineered SONOS) using a SiO2 buffer layer
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Lai, Sheng-Chih; Lue, Hang-Ting; Liao, Chien-Wei; Wu, Tai-Bor; Yang, Ming-Jui; Lue, Yi-Hsien; Hsieh, Jung-Yu; Wang, Szu-Yu; Luo, Guang-Li; Chien, Chao-Hsin; Hsieh, Kuang-Yeu; Liu, Rich; Lu, Chih-Yuan |
| 國立交通大學 |
2014-12-08T15:14:34Z |
Highly reliable multilevel and 2-bit/cell operation of wrapped select gate (WSG) SONOS memory
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Wu, Woei-Cherng; Chao, Tien-Sheng; Peng, Wu-Chin; Yang, Wen-Luh; Wang, Jer-Chyi; Chen, Jian-Hao; Lai, Chao-Sung; Yang, Tsung-Yu; Lee, Chien-Hsing; Hsieh, Tsung-Min; Liou, Jhyy Cheng |
| 國立交通大學 |
2014-12-08T15:41:01Z |
Highly reliable nickel silicide formation with a Zr capping layer
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Lee, TL; Lee, JW; Lee, MC; Lei, TF; Lee, CL |
| 國立成功大學 |
2006-09 |
Highly reliable nitride-based LEDs with internal ESD protection diodes
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Chang, Shoou-Jinn; Shen, C. F.; Shei, Shih-Chang; Chuang, R. W.; Chang, C. S.; Chen, W. S.; Ko, T. K.; Sheu, Jinn-Kong |
| 國立成功大學 |
2003-11 |
Highly reliable nitride-based LEDs with SPS plus ITO upper contacts
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Chang, Shoou-Jinn; Chang, C. S.; Su, Yan-Kuin; Chuang, R. W.; Lin, Y. C.; Shei, Shih-Chang; Lo, H. M.; Lin, H. Y.; Ke, J. C. |
| 國立交通大學 |
2014-12-08T15:20:49Z |
Highly reliable Si(3)N(4)-HfO(2) stacked heterostructure to fully flexible poly-(3-hexylthiophene) thin-film transistor
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Meena, Jagan Singh; Chu, Min-Ching; Wu, Chung-Shu; Chang, Feng-Chih; Ko, Fu-Hsiang |
| 國立交通大學 |
2019-04-02T05:58:52Z |
Highly reliable Si3N4-HfO2 stacked heterostructure to fully flexible poly-(3-hexylthiophene) thin-film transistor
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Meena, Jagan Singh; Chu, Min-Ching; Wu, Chung-Shu; Chang, Feng-Chih; Ko, Fu-Hsiang |
| 國立成功大學 |
2018-09 |
Highly Reliable Two-Step Charge-Pump Read Scheme for 1.5 F-2/Bit Nonlinear Sub-Teraohm 0TNR Vertical ReRAM
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Chien;Tsai-Kan;Chiou;Lih-Yih;Chang;Chi-Shian;Huang;Jing-Yu;Wu;Chung-Han;Lee;Heng-Yuan;Sheu;Shyh-Shyuan |
| 國立成功大學 |
2017-11-29 |
Highly Reliable Two-Step Charge-Pump Read Scheme for 1.5 F2/Bit Nonlinear Sub-Teraohm 0TNR Vertical ReRAM
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邱瀝毅; CHIOU, LIH-YIH;Chien, Tsai-Kan;Chang, Chi-Shian;Huang, Jing-Yu;Wu, Chung-Han;Lee, Heng-Yuan;Sheu, Shyh-Shyuan |
| 國立成功大學 |
2018 |
Highly Reliable Two-Step Charge-Pump Read Scheme for 1.5 F2/Bit Nonlinear Sub-Teraohm 0TNR Vertical ReRAM
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Chien, T.-K.;Chiou, L.-Y.;Chang, Chang C.-S.;Huang, J.-Y.;Wu, C.-H.;Lee, H.-Y.;Sheu, Sheu S.-S. |
Showing items 473206-473230 of 2348609 (93945 Page(s) Totally)
<< < 18924 18925 18926 18927 18928 18929 18930 18931 18932 18933 > >>
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