| 國立交通大學 |
2015-12-02T03:00:52Z |
Investigation of Cu-Zn Point Defect on the Photovaltaic Performance of the RF-Sputtered Cu2ZnSnSe4-Based Thin Film Solar Cell
|
Kuo, Shou-Yi; Hsieh, Dan-Hua; Yanga, Jui-Fu; Lai, Fang-I; Kuo, Hao-Chung |
| 國立交通大學 |
2018-08-21T05:53:01Z |
Investigation of Cu/In Thermosonic Bonding
|
Huang, Yan-Pin; Lu, Shu-Lin; Huang, Yu-Shang; Tseng, Yi-Hsiu; Shu, Min-Fong; Chen, Kuan-Neng |
| 國立交通大學 |
2014-12-08T15:41:32Z |
Investigation of Cu/TaN metal gate for metal-oxide-silicon devices
|
Tsui, BY; Huang, CF |
| 國立交通大學 |
2014-12-08T15:41:01Z |
Investigation of Cu/TaN metal gate for metal-oxide-silicon devices (vol 150, pg G22, 2003)
|
Tsui, BY; Huang, CF |
| 國立政治大學 |
2011-01 |
Investigation of Cu0.5Ni0.5/Nb interface transparency by using current-perpendicular-to-plane measurement
|
李尚凡; Huang,S. Y. ; Liang,J. J. ; Hsu,S. Y. ; Lin,L. K. ; Tsai,T. C. ; Lee,S. F. |
| 國立交通大學 |
2019-04-02T05:59:57Z |
Investigation of Cu0.5Ni0.5/Nb interface transparency by using current-perpendicular-to-plane measurement
|
Huang, S. Y.; Liang, J. J.; Hsu, S. Y.; Lin, L. K.; Tsai, T. C.; Lee, S. F. |
| 國立臺灣科技大學 |
2015 |
Investigation of Cu2SnSe3 and Mg-doped Cu2SnSe3 Thin Films for Photovoltaic Applications
|
Saragih, Albert Daniel |
| 元智大學 |
Dec-21 |
Investigation of Cu2ZnSnS4 thin film with preannealing process and ZnS buffer layer prepared by magnetron sputtering deposition
|
Wei-Sheng Liu; Chien-Sheng Huang; Shih-Yuan Chen; Ming-Yuan Lee; Hsing-Chun Kuo |
| 元智大學 |
Jul-21 |
Investigation of Cu2ZnSnS4 thin film with preannealing process and ZnS buffer layer prepared by magnetron sputtering deposition
|
Wei-Sheng Liu; Chien-Sheng Huang; Shih-Yuan Chen; Ming-Yuan Lee; Hsing-Chun Kuo |
| 國立成功大學 |
2017 |
Investigation of CuInSe 2 nanowire arrays with core–shell structure electrodeposited at various duty cycles into anodic alumina templates
|
Cheng, Y.-S.;Wang, N.-F.;Tsai, Y.-Z.;Lin, J.-J.;Houng, M.-P. |
| 國立成功大學 |
2017-02-28 |
Investigation of CuInSe2 nanowire arrays with core-shell structure electrodeposited at various duty cycles into anodic alumina templates
|
Cheng;Yu-Song;Wang;Na-Fu;Tsai;Yu-Zen;Lin;Jia-Jun;Houng;Mau-Phon |
| 國立高雄師範大學 |
2012 |
Investigation of CuO-doped NKN ceramics with high mechanical quality factor synthesized by a B-site oxide precursor method
|
Cheng-Shong Hong;S. L. Yang;C. C. Tsai;Y. C. Liou;C. S. Hong;B. J. Li;S. Y. Chu; 洪群雄 |
| 國立成功大學 |
2012-03 |
Investigation of CuO-Doped NKN Ceramics with High Mechanical Quality Factor Synthesized by a B-Site Oxide Precursor Method
|
Yang, Song-Ling; Tsai, Cheng-Che; Liou, Yi-Cheng; Hong, Cheng-Shong; Li, Bing-Jing; Chu, Sheng-Yuan |
| 元智大學 |
2007-06 |
Investigation of current characteristics of 2G mobile communication systems along the two north-south highways in Taiwan
|
周錫增; H.-K. Hwa; W-J Liao |
| 臺大學術典藏 |
2018-09-10T06:31:14Z |
Investigation of current characteristics of 2G mobile communication systems along the two north-south highways in Taiwan
|
Chou, H.-T.; Hwa, H.-K.; Liao, W.-J.; HSI-TSENG CHOU |
| 亞洲大學 |
201403 |
Investigation of Current Density and Hotspot Temperature Distribution Effects on P-channel LDMOSFET Unclamped Inductive Switching (UIS) Test
|
Erry Dwi Kur(Erry Dwi Kurniawan); Antonius Fra(Antonius Fran Yannu Pramudyo); , Ankit Kuma(, Ankit Kumar); 楊紹明(Shao-Ming Yang); 許健(Gene Sheu) |
| 亞洲大學 |
2014-03 |
Investigation of Current Density and Hotspot Temperature Distribution Effects on P-channel LDMOSFET Unclamped Inductive Switching ;UIS) Test
|
Kur, Erry Dwi;Kurniawan, Erry Dwi;Fra, Antonius; Ankit Kuma; Ankit Kumar;楊紹明;Yang, Shao-Ming;許健;Sheu, Gene |
| 國立中山大學 |
1985-11 |
Investigation of current generation by asymmetric heating
|
J. Gahl;K.L. Wong |
| 國立臺灣科技大學 |
2009-11-02 |
Investigation of Current Harmonics in Thruster AC Drives in Oil-Rig Platforms
|
Yadav, Parikshit; Cheah, C.W; Allana, Aneel. S; Lye, Too; Chang, C.S; Panda, Sanjib.K; Sahoo, S.K |
| 國立彰化師範大學 |
2008 |
Investigation of Current Matching for In0.49Ga0.51P/GaAs/Ge Triple-junction Tandem Solar Cell
|
Bi, Wu-Liang; Huang, Man-Fang; Kuo, Yen-Kuang |
| 國立臺灣大學 |
1990 |
Investigation of current status of immunization among 12 to 23 month old children in Taipei County, Taiwan.
|
Huang, Bi-Hua; Yen, Lee-Lan; Chin-Ying Chen; CKing, hwan-Chuen |
| 國立中山大學 |
1991-03 |
Investigation of current-voltage characteristics in pseudospark discharge
|
T.R. Chen;Y.T. Cheng;K.L. Wong |
| 國立交通大學 |
2014-12-08T15:29:01Z |
Investigation of Curtain Mura in TFT-TN panels after COG ACF process
|
Wang, Sheng-Ya; Liao, Wei-Hsiang; Yang, Kei-Hsiung |
| 臺北醫學大學 |
2010 |
Investigation of Cyanocobalamin Interferences to an Electrochemical Based Hemoglobin Test System
|
MS, Hsieh;TG, Wu;Su, J;WJ, Cheng;SM, Hsieh;WM, Chi |
| 臺北醫學大學 |
2010 |
Investigation of Cyanocobalamin Interferences to an Electrochemical Based Hemoglobin Test System
|
Hsieh, Ming-Song;Wu, Tai-Guang;Su, Jason;Cheng, Wen-Jing;Hsieh, Shu-Min;Chi, Wei-Ming |
| 亞洲大學 |
2012 |
Investigation of Cyclists Their Motivation, Constraints, and Promotion in Leisure Activity in Dapeng Bay Round-The-Bay Bikeway
|
Kang, Wenping |
| 國立成功大學 |
2023 |
Investigation of Cylindrical Anode Diameter Influence on Hollow Cathode Operating Characteristics
|
Hsieh, J.H.;Huang, Y.-L.;Huang, P.-H.;Wang, Wang W.-C.;Li, Y.-H. |
| 元智大學 |
2018-09-19 |
Investigation of CZTSe Solar Cells with Different Back Contacts
|
Fang-I Lai |
| 國立交通大學 |
2019-08-02T02:24:17Z |
Investigation of Data Pattern Effects on Nitride Charge Lateral Migration in a Charge Trap Flash Memory by Using a Random Telegraph Signal Method
|
Liu, Y. H.; Lin, H. Y.; Jiang, C. M.; Wang, Tahui; Tsai, W. J.; Lu, T. C.; Chen, K. C.; Lu, Chih-Yuan |
| 國立臺灣科技大學 |
2003 |
Investigation of DC electric arc furnace average power factor calculation using IEEE standard 1459
|
Chi-Jui Wu;Cheng-Ping Huang;Tsu-Hsun Fu;Tzu-Chih Zhao;Hung-Shian Kuo |
| 元培科技大學 |
2003-09-01 |
Investigation of DC Electric Arc Furnace Average Power Factor Calculation Using IEEE Standard 1459
|
Wu , Chi-Jui;Huang, Cheng-Ping;Fu, Tsu-Hsun, Zhao;Tzu-Chih ; Hung-Shian |
| 國立交通大學 |
2014-12-08T15:16:56Z |
Investigation of DC hot-carrier degradation at elevated temperatures for n-channel metal-oxide-semiconductor field-effect-transistor of 0.13 mu m technology
|
Lin, JC; Chen, SY; Chen, HW; Jhou, ZW; Lin, HC; Chou, S; Ko, J; Lei, TF; Haung, HS |
| 國立臺灣科技大學 |
2016 |
Investigation of defect free SiGe nanowire biosensor modified by dual plasma technology
|
Chen, Y.-M;Chang, T.-Y;Lai, C.-H;Chang, K.-M;Chen, Chen C.-F;Lai, Y.-L;Whang, A.J.-W;Lai, H.-L;Hsu, T.-R. |
| 國立交通大學 |
2017-04-21T06:56:03Z |
Investigation of Defect Free SiGe Nanowire Biosensor Modified by Dual Plasma Technology
|
Chen, Yi-Ming; Chang, Tai-Yuan; Lai, Chiung-Hui; Chang, Kow-Ming; Chen, Chu-Feng; Lai, Yi-Lung; Whang, Allen Jong-Woei; Lai, Hui-Lung; Hsu, Terng-Ren |
| 國立成功大學 |
2014-11 |
Investigation of defect modes in a defective photonic crystal with a semiconductor metamaterial defect
|
Wu, Meng-Ru; Wu, Chien-Jang; Chang, Shoou-Jinn |
| 國立成功大學 |
2015-08-24 |
Investigation of defect-induced abnormal body current in fin field-effect-transistors
|
Liu, Kuan-Ju; Chang, Ting-Chang; Chen, Ching-En; Yang, Ren-Ya; Tsai, Jyun-Yu; Lu, Ying-Hsin; Liu, Xi-Wen; Cheng, Osbert; Huang, Cheng-Tung |
| 國立交通大學 |
2015-12-02T02:59:24Z |
Investigation of defect-induced abnormal body current in fin field-effect-transistors
|
Liu, Kuan-Ju; Chang, Ting-Chang; Chen, Ching-En; Yang, Ren-Ya; Tsai, Jyun-Yu; Lu, Ying-Hsin; Liu, Xi-Wen; Cheng, Osbert; Huang, Cheng-Tung |
| 國立臺灣大學 |
1989 |
Investigation of defects in amorphous silicon films using positron annihilation
|
Chen, Yang-Fang; Wang, Chia-Chi; Tseng, Poh-Kun; Lue, Jun-Tseng |
| 臺大學術典藏 |
2018-09-10T07:26:33Z |
Investigation of defects in amorphous silicon films using positron annihilation
|
Chen, Y.-F.;Wang, C.-C.;Tseng, P.-K.;Lue, J.-T.; Chen, Y.-F.; Wang, C.-C.; Tseng, P.-K.; Lue, J.-T.; YANG-FANG CHEN |
| 國立交通大學 |
2017-04-21T06:49:32Z |
Investigation of defects in organic semiconductors by charge based Deep Level Transient Spectroscopy (Q-DLTS)
|
Nguyen, T. P.; Renaud, C.; Le Rendu, P.; Yang, S. H. |
| 南台科技大學 |
2023-04 |
Investigation of deformation of viscoelastic materials is applied with hollow touch force
|
Yu-Jung Lee |
| 國立成功大學 |
2020 |
Investigation of deformation pattern and sliding mode in dip slopes using discrete element method
|
Lin, C.-H.;Weng, M.-C.;Li, H.-H. |
| 國立成功大學 |
2021-05 |
Investigation of Degradation Behavior During Illuminated Negative Bias Temperature Stress in P-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors
|
Wang;Yu-Xuan;Chang;Ting-Chang;Tai;Mao-Chou;Wu;Chia-Chuan;Tu;Yu-Fa;Chen;Jian-Jie;Huang;Wei-Chen;Shih;Yu-Shan;Chen;Yu-An;Huang;Jen-Wei;Sze;Simon |
| 元智大學 |
2011-02 |
Investigation of degradation behavior of membrane electrode assembly with polytetrafluoroethylene/Nafion composite membrane
|
Ting-Chu Jao; Guo-Bin Jung; Pei-Hung Chi; Shih-Tsung Ke; Chan S.-H. |
| 元智大學 |
2011-02 |
Investigation of degradation behavior of membrane electrode assembly with polytetrafluoroethylene/Nafion composite membrane
|
Ting-Chu Jao; Guo-Bin Jung; Pei-Hung Chi; Shih-Tsung Ke; Chan S.-H. |
| 國立彰化師範大學 |
2003-04 |
Investigation of Degradation for Ohmic Performance of Oxidized Au/Ni/Mg-doped GaN
|
Lin, Yow-Jon; Li, Zhen-Dao; Hsu, Chou-Wei; Chien, Feng-Tso; Lee, Ching-Ting; Shao, Sheng-Tien; Chang, Hsing-Cheng |
| 國立臺灣科技大學 |
2006 |
Investigation of degradation in beryllium chalcogenide II-VI semiconductors
|
Tsai, W.C.;Cheng, C.L.;Chen, T.T.;Chen, Y.F.;Huang, Y.S.;Firszt, F.;Meczynska, H.;Marasek, A.;Legowski, S.;Strzakolski, K. |
| 臺大學術典藏 |
2018-09-10T05:50:16Z |
Investigation of degradation in beryllium chalcogenide II-VI semiconductors
|
Tsai, W.C.;Cheng, C.L.;Chen, T.T.;Chen, Y.F.;Huang, Y.S.;Firszt, F.;M?czy?ska, H.;Marasek, A.;??gowski, S.;Strzako?ski, K.; Tsai, W.C.; Cheng, C.L.; Chen, T.T.; Chen, Y.F.; Huang, Y.S.; Firszt, F.; M?czy?ska, H.; Marasek, A.; ??gowski, S.; Strzako?ski, K.; YANG-FANG CHEN |
| 國立交通大學 |
2018-08-21T05:56:42Z |
Investigation of Degradation of Single-Cell PV Module by Pressure Cooker Test and Damp Heat Test
|
Tung, Chao-Ming; Li, Yu-Tai; Yang, Wei-Lun; Wu, Hung-Sen; Yu, Peichen |
| 國立交通大學 |
2019-08-02T02:24:17Z |
Investigation of Degradation Phenomena in GaN-on-Si Power MIS-HEMTs under Source Current and Drain Bias Stresses
|
Yang, Chih-Yi; Wu, Tian-Li; Hsieh, Tin-En; Chang, Edward Yi |
