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Institution Date Title Author
義守大學 2011-11 Investigation of Novel Low Temperature Atmospheric Pressure Plasma System for Deposition Photo-catalytic TiO2 Thin Film Wen-Jen Liu;Yong-Long Lai
國立成功大學 2004-12 Investigation of novel microwave surface-acoustic-wave filter on different piezoelectric substrates Wang, Na-Fu; Tang, I-Tseng; Hung, Chen-I; Houng, Mau-Phon
元智大學 2013-09-24 Investigation of of Selenization Temperature on High Efficient CZTSe-Based Solar Cells by Sputter Technique S. Y. Kuo; D. H. Hsieh; J. F. Yang; Fang-I Lai; H. C. Kuo
國立成功大學 2006-08-15 Investigation of Ohmic mechanism for chlorine-treated p-type GaN using x-ray photoelectron spectroscopy Chen, Po-Sung; Lee, Ching-Ting
國立臺灣海洋大學 2015 Investigation of omnidirectional reflection band in ZnTe/ZnSe distributed Bragg reflector Ying-Shin Huang; Sheng-Yao Hu; Yueh-Chien Lee; Chung-Cheng Chang; Kwong-Kau Tiong; Ji-Lin Shen; Wu-Ching Chou
國立交通大學 2015-12-02T02:59:27Z Investigation of omnidirectional reflection band in ZnTe/ZnSe distributed Bragg reflector Huang, Ying-Shin; Hu, Sheng-Yao; Lee, Yueh-Chien; Chang, Chung-Cheng; Tiong, Kwong-Kau; Shen, Ji-Lin; Chou, Wu-Ching
國立交通大學 2014-12-08T15:35:26Z Investigation of on-current degradation behavior induced by surface hydrolysis effect under negative gate bias stress in amorphous InGaZnO thin-film transistors Liu, Kuan-Hsien; Chang, Ting-Chang; Chang, Kuan-Chang; Tsai, Tsung-Ming; Hsieh, Tien-Yu; Chen, Min-Chen; Yeh, Bo-Liang; Chou, Wu-Ching
國立成功大學 2014-03-10 Investigation of on-current degradation behavior induced by surface hydrolysis effect under negative gate bias stress in amorphous InGaZnO thin-film transistors Liu, Kuan-Hsien; Chang, Ting-Chang; Chang, Kuan-Chang; Tsai, Tsung-Ming; Hsieh, Tien-Yu; Chen, Min-Chen; Yeh, Bo-Liang; Chou, Wu-Ching
國立成功大學 2008-08-15 Investigation of optical and electrical properties of ZnO thin films Lai, Li-Wen; Lee, Ching-Ting
國立臺灣海洋大學 2015 Investigation of Optical and Flexible Characteristics for Organic-Based Cholesteric Liquid Crystal Display by Utilizing Bending and Torsion Loadings Bor-Jiunn Wen;Chang-Chun Lee;Jiong-Shiun Hsu;Pei-Chen Huang;Chia-Hao Tsai

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