|
English
|
正體中文
|
简体中文
|
Total items :0
|
|
Visitors :
52749854
Online Users :
718
Project Commissioned by the Ministry of Education Project Executed by National Taiwan University Library
|
|
|
|
Taiwan Academic Institutional Repository >
Browse by Title
|
Showing items 527081-527090 of 2348685 (234869 Page(s) Totally) << < 52704 52705 52706 52707 52708 52709 52710 52711 52712 52713 > >> View [10|25|50] records per page
| 國立聯合大學 |
2008 |
Investigation of electrical transient behavior for ultrasonic transducer in ON/OFF cycles
|
Kuo-Tsai Chang, Hsuang-Chang Chiang |
| 國立聯合大學 |
2007 |
Investigation of electrical transient behavior of an ultrasonic transducer under impulsive mechanical excitation
|
K.-T. Chang |
| 國立成功大學 |
2006-10-05 |
Investigation of electro-oxidation of methanol and benzyl alcohol at boron-doped diamond electrode: Evidence for the mechanism for fouling film formation
|
Chang, Chia-Chin; Chen, Li-Chia; Liu, Shyh-Jiun; Chang, Hsien-Chang |
| 元智大學 |
2017-06-22 |
Investigation of electrochemical approach for biochemical analysis of microbial culture system
|
Jian-An Su; Chi-Wei (John) Lan |
| 淡江大學 |
1998-01 |
Investigation of electrochemical behavior and mass-transfer process of C70 film. structure, size and temperature effect
|
王文竹; Wang, Wen-jwu; Chiu, H. S.; Lin, S. S.; Chang, C. S.; Chuang, K. S. |
| 義守大學 |
2016-04 |
Investigation of Electrochromic Properties of Novel Tungsten Trioxide Nano-structure Preparation Using Hydrothermal Process
|
Jia-Cian Hsieh;Wen-Jen Liu |
| 南台科技大學 |
2007 |
Investigation of Electrode Pattern Design for Nitride-based Light Emitting Diodes
|
邱裕中; 林陞羽; Chiou, Y.Z; Lin, S.Y. |
| 國立交通大學 |
2014-12-08T15:12:50Z |
Investigation of electroless Co(W,P) thin film as the diffusion barrier of underbump metallurgy
|
Wu, W. C.; Hsieh, Tsung-Eong; Pan, Hung-Chun |
| 國立交通大學 |
2014-12-08T15:16:17Z |
Investigation of electroless cobalt-phosphorous layer and its diffusion barrier properties of Pb-Sn solder
|
Liang, Muh-Wang; Yen, Hui-Ting; Hsieh, Tsung-Eong |
| 元智大學 |
2011-07 |
Investigation of Electromagnetic Interferences Caused by the Stacked I/O Connectors
|
H.-H. Chou; S-C Tuan; Chou H.-T.; Y-S Lee |
Showing items 527081-527090 of 2348685 (234869 Page(s) Totally) << < 52704 52705 52706 52707 52708 52709 52710 52711 52712 52713 > >> View [10|25|50] records per page
|