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Institution	Date	Title	Author
元智大學	2011-07	Investigation of Electromagnetic Interferences Caused by the Stacked I/O Connectors	H.-H. Chou; S-C Tuan; Chou H.-T.; Y-S Lee
國立臺灣科技大學	2009	Investigation of electromagnetic radiation from high power weather radar	Wen J.-Y.; Huang J.-F.
國立成功大學	2014-11	Investigation of electromigration reliability of redistribution lines in wafer-level chip-scale packages	Kao, Chin-Li; Chen, Tei-Chen; Lai, Yi-Shao; Chiu, Ying-Ta
國立交通大學	2020-01-02T00:04:18Z	Investigation of Electron and Hole Lateral Migration in Silicon Nitride and Data Pattern Effects on ${V}_{{t}}$ Retention Loss in a Multilevel Charge Trap Flash Memory	Liu, Yu-Heng; Zhan, Ting-Chien; Wang, Tahui; Tsai, Wen-Jer; Lu, Tao-Cheng; Chen, Kuang-Chao; Lu, Chih-Yuan
朝陽科技大學	2025-11-19	Investigation of Electron Transport Layer Influence on Asymmetric Bipolar Switching in Transparent BST-Based RRAM Devices	Chen, Kai-Huang; Kao, Ming-Cheng; Chen, Hsin-Chin; Wang, Yao-Chin; Cheng, Chien-Min; Xu, Wei-Min; 高銘政
國立交通大學	2014-12-08T15:43:08Z	Investigation of electron-optical phonon interactions in moderate wide InxGa1-xAs/GaAs strained quantum wells	Lin, SD; Lee, HC; Sun, KW; Lee, CP
元智大學	2011-02	INVESTIGATION OF ELECTRONIC PROPERTIES FORNANOTATANIA/METAL-ION-DOPED TITANIA SEMICONDUCTOR PREPARED BY SOL-GEL METHODS	馬智剛（Chih-Kang Ma）; Chau-Kuang Liau
國立彰化師範大學	2011-10	Investigation of Electronic Transport in Lateral NiFe/Al2O3/p-Si/Al2O3/NiFe Junctions	Lee, Y. C. ; Lin, C. W. ; Lee, H. M. ; Horng, Lance; Wu, J. C.
義守大學	2007/12/20	Investigation of Electrostatic Charges Trapping during 12-Inch Deep Submicron VLSI Proces	Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C.
國立交通大學	2014-12-08T15:01:50Z	Investigation of Electrostatic Integrity for Ultra-Thin-Body GeOI MOSFET Using Analytical Solution of Poisson's Equation	Hu, Vita Pi-Ho; Wu, Yu-Sheng; Su, Pin

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