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Showing items 527206-527215 of 2348719 (234872 Page(s) Totally)
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| 元智大學 |
2011-01 |
Investigation of GaN-based light-emitting diodes using double photonic crystal patterns
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H. W. Huang; Fang-I Lai; S.Y. Kuo; J. K. Huang; K.Y. Lee |
| 國立成功大學 |
2024-02-01 |
Investigation of GaN-Based Micro-LEDs with Effective Tetramethylammonium Hydroxide Treatment
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Wang;Zhen-Jin;Ye;Xin-Liang;Su;Li-Yun;Tu;Wei-Chen;Yang;Chih-Chiang;Su;Yan-Kuin |
| 國立交通大學 |
2014-12-08T15:11:10Z |
Investigation of GaN-based vertical-injection light-emitting diodes with GaN nano-cone structure by ICP etching
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Huang, H. W.; Lin, C. H.; Yu, C. C.; Lee, K. Y.; Lee, B. D.; Kuo, H. C.; Kuo, S. Y.; Leung, K. M.; Wang, S. C. |
| 國立交通大學 |
2014-12-08T15:33:13Z |
Investigation of Gate Oxide Short in FinFETs and the Test Methods for FinFET SRAMs
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Lin, Chen-Wei; Chao, Mango C. -T.; Hsu, Chih-Chieh |
| 中原大學 |
2009-08 |
Investigation of Gate Oxide Wear out Using Polysilazane-base Inorganic as Shallow Trench Filling
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Ching-Yuan. Ho; Kai-Yao. Shih; Jr Hau He |
| 國立交通大學 |
2014-12-08T15:33:46Z |
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013-09 |
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立交通大學 |
2018-08-21T05:53:21Z |
Investigation of Gate-Stacked In-Ga-Zn-O TFTs with Ga-Zn-O Source/Drain Electrodes by Atmospheric Pressure Plasma-Enhanced Chemical Vapor Deposition
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Wu, Chien-Hung; Chang, Kow-Ming; Chen, Yi-Ming; Huang, Bo-Wen; Zhang, Yu-Xin; Wang, Shui-Jinn; Hsu, Jui-Mei |
| 國立交通大學 |
2019-04-02T06:00:32Z |
Investigation of Gate-Stress Engineering in Negative Capacitance FETs Using Ferroelectric Hafnium Aluminum Oxides
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Cheng, Chun-Hu; Fan, Chia-Chi; Liu, Chien; Hsu, Hsiao-Hsuan; Chen, Hsuan-Han; Hsu, Chih-Chieh; Wang, Shih-An; Chang, Chun-Yen |
| 國立成功大學 |
2022 |
Investigation of Ge channel Complemental Field Effect Transistors (CFETs) Stacked Epitaxy or Layer Transfer
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Hong, T.-C.;Ren, Y.-S.;Su, C.-J.;Lee, Y.-J.;Chao, T.-S. |
Showing items 527206-527215 of 2348719 (234872 Page(s) Totally)
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