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Showing items 527621-527630 of 2348685 (234869 Page(s) Totally)
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| 臺大學術典藏 |
2021-05-24T13:07:22Z |
Investigation of normally-off p-gan/algan/gan hemts using a self-terminating etching technique with multi-finger architecture modulation for high power application
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YA-CHUN CHANG; Ho, Yu Li; Huang, Tz Yan; DING-WEI HUANG; CHAO-HSIN WU |
| 元智大學 |
2022-12-08 |
Investigation of normative references for sarcopenia among elderly in Taiwan: A retrospective study
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Hsiu-Wen Kuo; Chih-Dao Chen; Yang-Teng Fan |
| 義守大學 |
2011-11 |
Investigation of Novel Low Temperature Atmospheric Pressure Plasma System for Deposition Photo-catalytic TiO2 Thin Film
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Wen-Jen Liu;Yong-Long Lai |
| 國立成功大學 |
2004-12 |
Investigation of novel microwave surface-acoustic-wave filter on different piezoelectric substrates
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Wang, Na-Fu; Tang, I-Tseng; Hung, Chen-I; Houng, Mau-Phon |
| 元智大學 |
2013-09-24 |
Investigation of of Selenization Temperature on High Efficient CZTSe-Based Solar Cells by Sputter Technique
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S. Y. Kuo; D. H. Hsieh; J. F. Yang; Fang-I Lai; H. C. Kuo |
| 國立成功大學 |
2006-08-15 |
Investigation of Ohmic mechanism for chlorine-treated p-type GaN using x-ray photoelectron spectroscopy
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Chen, Po-Sung; Lee, Ching-Ting |
| 國立臺灣海洋大學 |
2015 |
Investigation of omnidirectional reflection band in ZnTe/ZnSe distributed Bragg reflector
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Ying-Shin Huang; Sheng-Yao Hu; Yueh-Chien Lee; Chung-Cheng Chang; Kwong-Kau Tiong; Ji-Lin Shen; Wu-Ching Chou |
| 國立交通大學 |
2015-12-02T02:59:27Z |
Investigation of omnidirectional reflection band in ZnTe/ZnSe distributed Bragg reflector
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Huang, Ying-Shin; Hu, Sheng-Yao; Lee, Yueh-Chien; Chang, Chung-Cheng; Tiong, Kwong-Kau; Shen, Ji-Lin; Chou, Wu-Ching |
| 國立交通大學 |
2014-12-08T15:35:26Z |
Investigation of on-current degradation behavior induced by surface hydrolysis effect under negative gate bias stress in amorphous InGaZnO thin-film transistors
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Liu, Kuan-Hsien; Chang, Ting-Chang; Chang, Kuan-Chang; Tsai, Tsung-Ming; Hsieh, Tien-Yu; Chen, Min-Chen; Yeh, Bo-Liang; Chou, Wu-Ching |
| 國立成功大學 |
2014-03-10 |
Investigation of on-current degradation behavior induced by surface hydrolysis effect under negative gate bias stress in amorphous InGaZnO thin-film transistors
|
Liu, Kuan-Hsien; Chang, Ting-Chang; Chang, Kuan-Chang; Tsai, Tsung-Ming; Hsieh, Tien-Yu; Chen, Min-Chen; Yeh, Bo-Liang; Chou, Wu-Ching |
Showing items 527621-527630 of 2348685 (234869 Page(s) Totally)
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