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Taiwan Academic Institutional Repository >
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Showing items 528431-528440 of 2348638 (234864 Page(s) Totally) << < 52839 52840 52841 52842 52843 52844 52845 52846 52847 52848 > >> View [10|25|50] records per page
| 中華大學 |
2007 |
Investigation of Toughness and Wear Resistance of a-C/a-C:Cr Multilayer Coatings
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馬廣仁; Ma, Kung-Jen |
| 國立臺灣科技大學 |
2016 |
Investigation of transformer banks with delta-connected secondary windings and various grounding methods for delta service
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Chen, T.-H;Liao, R.-N. |
| 臺大學術典藏 |
2021-10-07T08:46:29Z |
Investigation of Transient Behaviors of a Cantilever Plate Based on Impact Loading History Detection Using Polyvinylidene Fluoride (PVDF) Films
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Kuo-Chih Chuang; Kang-Che Huang; Hong-Cin Liou; Chien-Ching Ma; CHIEN-CHING MA |
| 元智大學 |
2007-09 |
Investigation of Transient Water Management of PEM Fuel Cell membrane at different Load Changes
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翁芳柏; 蘇艾; 詹世弘; Jou, B.S.; Chi, P.H. |
| 國立成功大學 |
2014-12 |
Investigation of transonic bi-convex corner flows
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Chung, Kung-Ming; Chang, Po-Hsiung; Chang, Keh-Chin; Lu, Frank K. |
| 臺大學術典藏 |
2019-12-19T08:37:30Z |
Investigation of transport dynamics in oleic acid-induced transdermal drug delivery by two-photon fluorescence microscopy: An ex-vivo study of mouse skin
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CHEN-YUAN DONG; Dong, C.-Y.; Tsai, T.-H.; Yang, C.-S.; Hsu, H.-C.; Tseng, T.-Y.; Tseng, T.-Y.; Hsu, H.-C.; Yang, C.-S.; Tsai, T.-H.; Dong, C.-Y. |
| 國立成功大學 |
2005 |
Investigation of transport mechanism for strained Si n metal-oxide-semiconductor field-effect transistor grown on multi-layer substrate
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Wang, Yen-Ping; Wu, San-Lein; Chang, Shoou-Jinn |
| 國立成功大學 |
2014-08-11 |
Investigation of trap properties in high-k/metal gate p-type metal-oxide-semiconductor field-effect-transistors with aluminum ion implantation using random telegraph noise analysis
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Kao, Tsung-Hsien; Chang, Shoou-Jinn; Fang, Yean-Kuen; Huang, Po-Chin; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Wu, Chung-Yi; Wu, San-Lein |
| 國立成功大學 |
2014-08 |
Investigation of trap properties of Hf0.83Zr0.17O2 high-k gate stack p-type MOSFETs by low-frequency (1/f) noise and random telegraph noise analyses
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Tsar, Shih-Chang; Wu, San-Lein; Huang, Po-Chin; Wang, Bo-Chin; Tsai, Kai-Shiang; Kao, Tsung-Hsien; Yang, Chih-Wei; Chen, Cheng-Guo; Cheng, Osbert; Fang, Yean-Kuen; Chang, Shoou-Jinn; Chen, Jone-Fang |
| 國立交通大學 |
2017-04-21T06:56:31Z |
Investigation of Traps at MoS2/Al2O3 Interface in nMOSFETs by Low-Frequency Noise
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Yuan, Hui-Wen; Shen, Hui; Li, Jun-Jie; Shao, Jinhai; Huang, Daming; Chen, Yi-Fang; Wang, P. F.; Ding, S. J.; Liu, W. J.; Chin, Albert; Li, Ming-Fu |
Showing items 528431-528440 of 2348638 (234864 Page(s) Totally) << < 52839 52840 52841 52842 52843 52844 52845 52846 52847 52848 > >> View [10|25|50] records per page
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