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Showing items 528431-528440 of 2348638  (234864 Page(s) Totally)
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Institution Date Title Author
中華大學 2007 Investigation of Toughness and Wear Resistance of a-C/a-C:Cr Multilayer Coatings 馬廣仁; Ma, Kung-Jen
國立臺灣科技大學 2016 Investigation of transformer banks with delta-connected secondary windings and various grounding methods for delta service Chen, T.-H;Liao, R.-N.
臺大學術典藏 2021-10-07T08:46:29Z Investigation of Transient Behaviors of a Cantilever Plate Based on Impact Loading History Detection Using Polyvinylidene Fluoride (PVDF) Films Kuo-Chih Chuang; Kang-Che Huang; Hong-Cin Liou; Chien-Ching Ma; CHIEN-CHING MA
元智大學 2007-09 Investigation of Transient Water Management of PEM Fuel Cell membrane at different Load Changes 翁芳柏; 蘇艾; 詹世弘; Jou, B.S.; Chi, P.H.
國立成功大學 2014-12 Investigation of transonic bi-convex corner flows Chung, Kung-Ming; Chang, Po-Hsiung; Chang, Keh-Chin; Lu, Frank K.
臺大學術典藏 2019-12-19T08:37:30Z Investigation of transport dynamics in oleic acid-induced transdermal drug delivery by two-photon fluorescence microscopy: An ex-vivo study of mouse skin CHEN-YUAN DONG; Dong, C.-Y.; Tsai, T.-H.; Yang, C.-S.; Hsu, H.-C.; Tseng, T.-Y.; Tseng, T.-Y.; Hsu, H.-C.; Yang, C.-S.; Tsai, T.-H.; Dong, C.-Y.
國立成功大學 2005 Investigation of transport mechanism for strained Si n metal-oxide-semiconductor field-effect transistor grown on multi-layer substrate Wang, Yen-Ping; Wu, San-Lein; Chang, Shoou-Jinn
國立成功大學 2014-08-11 Investigation of trap properties in high-k/metal gate p-type metal-oxide-semiconductor field-effect-transistors with aluminum ion implantation using random telegraph noise analysis Kao, Tsung-Hsien; Chang, Shoou-Jinn; Fang, Yean-Kuen; Huang, Po-Chin; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Wu, Chung-Yi; Wu, San-Lein
國立成功大學 2014-08 Investigation of trap properties of Hf0.83Zr0.17O2 high-k gate stack p-type MOSFETs by low-frequency (1/f) noise and random telegraph noise analyses Tsar, Shih-Chang; Wu, San-Lein; Huang, Po-Chin; Wang, Bo-Chin; Tsai, Kai-Shiang; Kao, Tsung-Hsien; Yang, Chih-Wei; Chen, Cheng-Guo; Cheng, Osbert; Fang, Yean-Kuen; Chang, Shoou-Jinn; Chen, Jone-Fang
國立交通大學 2017-04-21T06:56:31Z Investigation of Traps at MoS2/Al2O3 Interface in nMOSFETs by Low-Frequency Noise Yuan, Hui-Wen; Shen, Hui; Li, Jun-Jie; Shao, Jinhai; Huang, Daming; Chen, Yi-Fang; Wang, P. F.; Ding, S. J.; Liu, W. J.; Chin, Albert; Li, Ming-Fu

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