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Showing items 528651-528660 of 2348674 (234868 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:22:48Z |
Investigation on residual stress and stress-optical coefficient for flexible electronics by photoelasticity
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Lee, Y. C.; Liu, T. S.; Wu, C. I.; Lin, W. Y. |
| 國家衛生研究院 |
2021-10-12 |
Investigation on returning to work in liver cancer survivors in Taiwan: A 5-year follow-up study
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Yang, SW;Chen, WL;Wu, WT;Wang, CC |
| 國立交通大學 |
2017-04-21T06:48:25Z |
Investigation on RF characteristics of stacked P-I-N polysilicon diodes for ESD protection design in 0.18-mu m CMOS technology
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Shiu, Yu-Da; Chuang, Che-Hao; Ker, Ming-Dou |
| 國立交通大學 |
2014-12-08T15:10:44Z |
Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology
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Ker, Ming-Dou; Lai, Tai-Hsiang |
| 義守大學 |
2008-11 |
Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology
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Ming-Dou Ker;Tai-Hsiang Lai |
| 國立交通大學 |
2014-12-08T15:32:12Z |
Investigation on Safe Operating Area and ESD Robustness in a 60-V BCD Process with Different Deep P-Well Test Structures
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Dai, Chia-Tsen; Ker, Ming-Dou |
| 國立交通大學 |
2016-03-28T00:05:42Z |
Investigation on SCR-based ESD protection device for biomedical integrated circuits in a 0.18-mu m CMOS process
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Lin, Chun-Yu; Chiu, Yan-Lian |
| 國立交通大學 |
2014-12-08T15:18:35Z |
Investigation on seal-ring rules for IC product reliability in 0.25-mu m CMOS technology
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Chen, SH; Ker, MD |
| 臺大學術典藏 |
2020-04-21T06:11:19Z |
Investigation on sequence variations related to insecticide resistance in Bactrocera dorsalis
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Yen-Jen Oyang.; JU-CHUN HSU; Chien-Yu Chen; Ju-Chun Hsu; Li-Hsin Huang; Tony Kuo; Chia-Cheng Hu; Jian-Long Huang |
| 亞洲大學 |
2015 |
Investigation on service recovery and repurchase intention -The viewpoint of web quality
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Wang, Zhao Wen |
Showing items 528651-528660 of 2348674 (234868 Page(s) Totally)
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