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Showing items 549101-549110 of 2348617 (234862 Page(s) Totally)
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| 臺大學術典藏 |
2018-09-10T18:04:44Z |
Lifetime exposure to particulate air pollutants is negatively associated with lung function in non-asthmatic children
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Tsui, H.-C. ; Chen, C.-H. ; Wu, Y.-H. ; Chiang, H.-C. ; Chen, B.-Y. ; Guo, Y.L.; YUE-LIANG GUO |
| 元智大學 |
2017-05-07 |
Lifetime Improvement of Blue OLED
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Bo-Yen Lin; Ming-Zer Lee; Po-Chen Tseng; Tien-Lung Chiu; Chi-Feng Lin; Julie Hsieh; Stanley Chen; Jiun-Haw Lee |
| 國立交通大學 |
2014-12-08T15:11:19Z |
Lifetime improvement of organic light emitting diodes using LiF thin film and UV glue encapsulation
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Huang, Jian-Ji; Su, Yan-Kuin; Chang, Ming-Hua; Hsieh, Tsung-Eong; Huang, Bohr-Ran; Wang, Shun-Hsi; Chen, Wen-Ray; Tsai, Yu-Sheng; Hsieh, Huai-En; Liu, Mark O.; Juang, Fuh-Shyang |
| 國立成功大學 |
2008-07 |
Lifetime improvement of organic light emitting diodes using LiF thin film and UV glue encapsulation
|
Huang, Jian-Ji; Su, Yan-Kuin; Chang, Ming-Hua; Hsieh, Tsung-Eong; Huang, Bohr-Ran; Wang, Shun-Hsi; Chen, Wen-Ray; Tsai, Yu-Sheng; Hsieh, Huai-En; Liu, Mark O.; Juang, Fuh-Shyang |
| 淡江大學 |
2019-12-14 |
Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model
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Tsai, C. C.;Lin, C. T. |
| 淡江大學 |
2015-04-14 |
Lifetime inference for highly reliable products based on skew-normal accelerated destructive degradation test model
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Tsai, Chih-Chun; Lin, Chien-Tai |
| 淡江大學 |
2015-12-04 |
Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model
|
Tsai, Chih-Chun; Lin, Chien-Tai |
| 淡江大學 |
2015-12 |
Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model
|
Tsai, Chih-Chun; Lin, Chien-Tai |
| 淡江大學 |
2016-06-27 |
Lifetime inference for highly reliable products based on skew-normal accelerated destructive degradation test model
|
Tsai, Chih-Chun; Lin, Chien-Tai |
| 淡江大學 |
2019-12-14 |
Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model
|
Tsai, C. C.;Lin, C. T. |
Showing items 549101-549110 of 2348617 (234862 Page(s) Totally)
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