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Institution	Date	Title	Author
國立臺灣大學	1991	Nanometer Scale Focused Ion Beam Vacuum Lithography Using an Ultrathin Native Oxide Resist	王玉麟; Harriott, L. R.; Temkin, H.; Chu, C. H.; Hseih, Y. F.; Hamm, R. A.; Panish, M. B.; Wade, H. H.; Wang, Yuh-Lin; Harriott, L. R.; Temkin, H.; Chu, C. H.; Hseih, Y. F.; Hamm, R. A.; Panish, M. B.; Wade, H. H.
淡江大學	2011-12	Nanometer Scale Mechanical Behavior of Grain Boundaries	Wang, C. K., Chew, H. B., Kim, K. S.
臺大學術典藏	2020-03-02T03:25:53Z	Nanometer scale mechanical behavior of grain boundaries	Wang C.-K.; Chew H.B.; Kim K.-S.; CHIEN-KAI WANG
國立中山大學	1998	Nanometer scale mixing homogeneity in light emitting polymer blend thin films	Jui-Hung Hsu; Pei-Kuen Wei; Wunshain Fann; Kuen-Ru Chuang; Show-An Chen
國立交通大學	2014-12-08T15:04:02Z	NANOMETER THICK SI/SIGE STRAINED-LAYER SUPERLATTICES GROWN BY AN ULTRAHIGH-VACUUM CHEMICAL-VAPOR-DEPOSITION TECHNIQUE	CHANG, TC; CHANG, CY; JUNG, TG; TSAI, WC; WANG, PJ; LEE, TL; CHEN, LJ
臺大學術典藏	2019-12-27T07:49:42Z	Nanometer thick single crystal Y2 O3 films epitaxially grown on Si (111) with structures approaching perfection	Nieh, C.W.; Lee, Y.J.; Lee, W.C.; Yang, Z.K.; Kortan, A.R.; Hong, M.; Kwo, J.; Hsu, C.-H.; MINGHWEI HONG
臺大學術典藏	2018-09-10T07:01:21Z	Nanometer thick single crystal Y2O3 films epitaxially grown on Si (111) with structures approaching perfection	Nieh, CW; Lee, YJ; Lee, WC; Yang, ZK; Kortan, AR; Hong, M; Kwo, J; Hsu, CH; MINGHWEI HONG
高雄醫學大學	2008	Nanometer titanium dioxide adsorption for arsenic speciation analysis by electrothermal atomic absorption spectrometry without chromatographic separation	李正發;許耕彰;陳百薰;黃友利
國立交通大學	2014-12-08T15:07:37Z	Nanometer-nanosecond dynamics in laser-induced expansion/contraction and ablation of polymer films	Tada, Takuji; Masuhara, Hiroshi
國立成功大學	2000-01	Nanometer-scale conversion of Si3N4 to SiOx	Chien, F. S. S.; Chang, J. W.; Lin, S. W.; Chou, Y. C.; Chen, T. T.; Gwo, S.; Chao, T. S.; Hsieh, Wen-Feng

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