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Showing items 617446-617455 of 2348719 (234872 Page(s) Totally)
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| 國立成功大學 |
2020-02-1 |
Noncrystallographic symmetry-constrained map obtained by direct density optimization
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Yoshimura;Masato;Chen;Nai-Chi;Guan;Hong-Hsiang;Chuankhayan;Phimonphan;Lin;Chien-Chih;Nakagawa;Atsushi;Chen;Chun-Jung |
| 國立成功大學 |
2018-09 |
Nondata-Aided Doppler Frequency Estimation for OFDM Systems Over Doubly Selective Fading Channels
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Chin;Wen-Long |
| 臺大學術典藏 |
2018-09-10T04:07:45Z |
Nondegrading photoluminescence in porous silicon by deuterium plasma treatment
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Chen, C.H.;Chen, Y.F.;Shih, A.;Lee, S.C.; Chen, C.H.; Chen, Y.F.; Shih, A.; Lee, S.C.; YANG-FANG CHEN |
| 國立臺灣大學 |
2002 |
Nondegrading photoluminescence in porous silicon by deuterium plasma treatment
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Chen, C. H.; Chen, Y. F.; Shih, An; Lee, S. C. |
| 義守大學 |
2006-04 |
Nondestructive analysis of interconnection in two-die BGA using TDR
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Ming-Kun Chen;Cheng-Chi Tai;Yu-Jung Huang |
| 國立成功大學 |
2006-04 |
Nondestructive analysis of interconnection in two-die BGA using TDR
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Chen, Ming-Kun; Tai, Cheng-Chi; Huang, Yu-Jung |
| 國立臺灣大學 |
1986 |
Nondestructive Characterization of RBSOA of High Power-Bipolar Transistors
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Jovanovic, M. M.; Lee, F. C.; Chen, D. Y. |
| 臺大學術典藏 |
2018-09-10T06:02:48Z |
Nondestructive Characterization of RBSOA of High Power-Bipolar Transistors
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M. M. Jovanovic;F. C. Lee;D. Y. Chen; M. M. Jovanovic; F. C. Lee; D. Y. Chen; DAN CHEN |
| 國立交通大學 |
2014-12-08T15:27:02Z |
Nondestructive characterization of the film quality and stress states in diamond films on various substrates
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Kuo, CT; Wu, JY; Chou, SL |
| 國立臺灣大學 |
2007 |
Nondestructive continuous physical property measurements of core samples recovered from hole B, Taiwan Chelungpu-Fault Drilling Project
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Hirono, T; Yeh, EC; Lin, WR; Sone, H; Mishima, T; Soh, W; Hashimoto, Y; Matsubayashi, O; Aoike, K; Ito, H; Kinoshita, M; Murayama, M; Song, SR; Ma, KF; Hung, JH; Wang, CY; Tsai, YB; Kondo, T; Nishimura, M; Moriya, S; Tanaka, T; Fujiki, T; Maeda, L |
Showing items 617446-617455 of 2348719 (234872 Page(s) Totally)
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