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Showing items 858496-858505 of 2346788 (234679 Page(s) Totally) << < 85845 85846 85847 85848 85849 85850 85851 85852 85853 85854 > >> View [10|25|50] records per page
| 淡江大學 |
2024-03-17 |
The Reliability Inference for Multicomponent Stress–Strength Model under the Burr X Distribution
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Tsai, Tzong-ru |
| 國立臺灣科技大學 |
1998 |
The reliability life analysis of microelectronic devices
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Wang, F. K. |
| 亞洲大學 |
2009 |
The Reliability of 200V P-channel Silicon-On-Insulator LDMOS on High Side operation
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楊紹明;Yang, Shao-Ming;許健;Sheu, Gene |
| 中華大學 |
2009 |
The reliability of a friction measurement device on the assessment of slip and fall risk
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李開偉; Li, Kai Way |
| 元智大學 |
2009-06 |
The Reliability of Aggregated Probability Judgments Obtained through Cooke's Classical Model
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林希偉; 鄭治炘 |
| 國立政治大學 |
2007-06 |
The Reliability of Alliances and Extended Deterrence: A Game-Theoretical Analysis
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陳和全;Neilson, William S.; Chen, Ho-Chyuan;Neilson, William S. |
| 國立交通大學 |
2014-12-08T15:27:19Z |
The reliability of amorphous silicon thin film transistors for LCD under DC and AC stresses
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Cheng, HC; Huang, CY; Lin, JW; Kung, JJH |
| 國立臺灣大學 |
2007- |
The Reliability of Detection in Wireless Sensor Networks: Modeling and Analyzing
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Hsu, M.T.; Lin, F.Y.S.; Juang, Y.S.; Chang, T.Y. |
| 國立臺灣大學 |
2007 |
The Reliability of Detection in Wireless Sensor Networks: Modeling and Analyzing
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Hsu, M.T.Lin, F.Y.S.; Chang, Y.S.; Yang, T.Y. |
| 臺大學術典藏 |
2020-02-11T02:34:54Z |
The reliability of detection in wireless sensor networks: Modeling and analyzing
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Hsu, M.-T;Lin, F.Y.-S;Chang, Y.-S;Juang, T.-Y.; Hsu, M.-T; Lin, F.Y.-S; Chang, Y.-S; Juang, T.-Y.; YEONG-SUNG LIN |
Showing items 858496-858505 of 2346788 (234679 Page(s) Totally) << < 85845 85846 85847 85848 85849 85850 85851 85852 85853 85854 > >> View [10|25|50] records per page
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