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Institution	Date	Title	Author
國立臺灣科技大學	2014	Thickness-dependent electrical conductivities and ohmic contacts in transition metal dichalcogenides multilayers	Chen, R.-S.;Tang, C.-C.;Shen, W.-C.;Huang, Y.-S.
淡江大學	2009	Thickness-Dependent Electronic Structure of Intermetallic CeCo2 Nanothin Films Studied by X-ray Absorption Spectroscopy	Dong, Chung-Li; Chen, Chi-Liang; Asokan, Kandasami; Chang, Ching-Lin; Chen, Yang-Yuan; Lee, Jyh-Fu; Guo, Jinghua
元智大學	Nov-20	Thickness-Dependent Exciton Dynamics in Thermally Evaporated Rubrene Thin Films	Chia-Hsun Chen; Pin-Hao Sher; Wing-Kit Choi; Christopher J. Bardeen; Tien-Lung Chiu; Juen-Kai Wang; Jiun-Haw Lee
國立成功大學	2023	Thickness-Dependent Ferroelectricity in Freestanding Hf0.5Zr0.5O2 Membranes	Liu, Y.-C.;Chen, B.-C.;Wei, C.-C.;Ho, S.-Z.;Liou, Y.-D.;Kaur, P.;Rahul, N.;Chen, Y.-C.;Yang, J.-C.
國立成功大學	2024-02-23	Thickness-Dependent Ferroelectricity in Freestanding Hf0.5Zr0.5O2 Membranes	Liu;Yu-Chen;Chen;Bo-Cia;Wei;Chia-Chun;Ho;Sheng-Zhu;Liou;Yi-De;Kaur;Puneet;Chen;Yi-Chun;Yang;Jan-Chi
國立交通大學	2014-12-08T15:28:21Z	Thickness-dependent lattice relaxation and the associated optical properties of ZnO epitaxial films grown on Si (111)	Liu, W. -R.; Lin, B. H.; Kuo, C. C.; Lee, W. C.; Hong, M.; Kwo, J.; Hsu, C. -H.; Hsieh, W. F.
臺大學術典藏	2018-09-10T09:20:51Z	Thickness-dependent lattice relaxation and the associated optical properties of ZnO epitaxial films grown on Si (111)	Liu, W-R; Lin, BH; Kuo, CC; Lee, WC; Hong, M; Kwo, J; Hsu, C-H; Hsieh, WF; MINGHWEI HONG
修平科技大學	2003-08	Thickness-Dependent Leakage Current of (Polyvinylidene Fluoride/Lead Titanate) Pyroelectric detectors	M. C. Kao;C. M. Wang;H. Z. Chen;M. S. Lee;Y. C. Chen
國立中山大學	2003	Thickness-Dependent Leakage Current of (Polyvinylidene Fluoride/Lead Titanate) Pyroelectric Detectors	M.C. KAO; C.M. Wang; H.Z. Chen; M.S. Lee; Y.C. Chen
國立中山大學	2002-06	Thickness-Dependent Leakage Current of (PVDF/PbTiO3) Pyroelectric Bilayer Thin Film Detectors	M.C. Kao;C.M. Wang;Y.C. Chen

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