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Institution Date Title Author
國立交通大學 2014-12-08T15:39:11Z Transmission characteristics of smiling pattern resonators Hsu, YJ; Chern, JL
中國文化大學 2008 Transmission characteristics of various bent periodic dielectric waveguides Lee, Keh-Yi; Chen, Chun-Nan; Lin, Yan-Jih
國立臺灣科技大學 2011 Transmission coefficient estimation based on power measurements using a hybrid coupler Yu-Chun Chu;Wen-Jiao Liao
國立交通大學 2014-12-08T15:45:41Z Transmission coefficients in a narrow constriction threaded by two impenetrable magnetic flux tubes Liang, HC
國立交通大學 2014-12-08T15:04:30Z TRANSMISSION COEFFICIENTS IN THE ELECTRON-ATOM SCATTERING IN INTENSE LASER FIELD HAN, CS
國立交通大學 2014-12-08T15:26:10Z Transmission coefficients measurement of building materials for UWB systems in 3-10 GHz Lao, RR; Tarng, JH; Hsiao, C
淡江大學 2019-04-27 Transmission Effect of the U.S. and China’s Monetary Policy Changes on the World Chiang, S.M.' Liu, H.C.;Huang, Chien-Ming
國立彰化師範大學 2010 Transmission Electron Beam Drilling for Nanoscale Fabrication Lin, Tsan-Chu; Su, Rui-Zhi; Lai, Yu-Cheng; Wang, Dau-Chung; Wu, Cen-Shawn
國立成功大學 1975-05 Transmission Electron Diffraction of Vacuum-deposited GaAs Films 洪銘盤
國立交通大學 2014-12-08T15:46:06Z Transmission electron microscope investigation of the interface between titanium and zirconia Lin, KF; Lin, CC
淡江大學 2004-01-15 Transmission electron microscopic microstructure of base-metal-electroded BaTiO3 capacitor materials with duplex structures Chen, Cheng-sao; Chou, Chen-chia; Yang, Wei-chun; Hu, Chen-ti; 林諭男; Lin, I-nan
國立臺灣科技大學 2003 Transmission Electron Microscopic Microstructure of Base-Metal-Electroded BaTiO3 Capacitor Materials with Duplex Structures Cheng-Sao Chen;Chen-Chia Chou;Wei-Chun Yang;Chen-Ti Hu;I-Nan Lin
國立臺灣科技大學 2004 Transmission Electron Microscopic Microstructure of Base-Metal-Electroded BaTiO3 Capacitor Materials with Duplex Structures Cheng-Sao Chen;Chen-Chia Chou;Wei-Chun Yang;Chen-Ti Hu;I-Nan Lin
國立成功大學 2002-07 Transmission electron microscopic study of early stage gamma(1) (Ag2Hg3) and beta(1) (Ag-Hg) phases - Technical note Lin, Jiin-Huey Chern; Chen, Kang-I; Ju, Chien-Ping
國立中山大學 2005 Transmission electron microscopic study of quartz rods with intergrown amphibole within omphacite in eclogites from the Sulu ultrahigh-pressure metamorphic terrane, eastern China Y.H. Shau; H.C. Tsai; Y.H. Liu; S.C. Yu; J. Yang; Z. Xu
國立成功大學 2005-04 Transmission electron microscopic study of tetracalcium phosphate surface-treated in diammonium hydrogen phosphate solution Wang, I-Chang; Lin, Jiin-Huey Chern; Ju, Chien-Ping
國立成功大學 2004-10 Transmission electron microscopic study of whisker formation on tetracalcium phosphate in hydrochloric acid Lin, Kuan-Liang; Lin, Jiin-Huey Chern; Ju, Chien-Ping
國立成功大學 2003-03-15 Transmission electron microscopic study on setting mechanism of tetracalcium phosphate/dicalcium phosphate anhydrous-based calcium phosphate cement Chen, Wen-Cheng; Lin, Jiin-Huey Chern; Ju, Chien-Ping
國立交通大學 2014-12-08T15:16:09Z Transmission electron microscopy assessment of the Si enhancement of Ti/Al/Ni/Au Ohmic contacts to undoped AIGaN/GaN heterostructures Desmaris, Vincent; Shiu, Jin-Yu; Lu, Chung-Yu; Rorsman, Niklas; Zirath, Herbert; Chang, Edward-Yi
臺大學術典藏 2020-04-24T08:53:15Z Transmission electron microscopy characterization of HfO 2/GaAs(001) heterostructures grown by molecular beam epitaxy Liou, S.C.; Chu, M.-W.; Chen, C.H.; Lee, Y.J.; Chang, P.; Lee, W.C.; Hong, M.; Kwo, J.
臺大學術典藏 2019-12-27T07:49:41Z Transmission electron microscopy characterization of HfO 2/GaAs(001) heterostructures grown by molecular beam epitaxy Liou, S.C.; Chu, M.-W.; Chen, C.H.; Lee, Y.J.; Chang, P.; Lee, W.C.; Hong, M.; Kwo, J.; MINGHWEI HONG
臺大學術典藏 2018-09-10T07:01:20Z Transmission electron microscopy characterization of HfO2/GaAs (001) heterostructures grown by molecular beam epitaxy Liou, SC; Chu, M-W; Chen, CH; Lee, YJ; Chang, P; Lee, WC; Hong, M; Kwo, J; MINGHWEI HONG
國立臺灣大學 2008-06 Transmission electron microscopy characterization of HfO2/GaAs(001) heterostructures grown by molecular beam epitaxy Liou, SC; Chu, MW; Chen, CH
國立臺灣大學 2010 Transmission Electron Microscopy Characterization of Ni(V) Metallization Stressed Under High Current Density in Flip Chip Solder Joints Tsai, M.Y.; Lin, Y.L.; Lin, Y.W.; Ke, J.H.; Kao, C.R.
臺大學術典藏 2019-11-27T02:02:48Z Transmission electron microscopy characterization of the porous structure induced by high current density in the flip-chip solder joints C. ROBERT KAO;Kao C.R.;Lin Y.-L.;Tsai M.-Y.; Tsai M.-Y.; Lin Y.-L.; Kao C.R.; C. ROBERT KAO

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